ABSTRACT
Objective@#To understand the early infant diagnosis (EID) test rate and associated factors in HIV-exposed children in China during 2015-2017.@*Methods@#The follow-up information cards of 12 096 HIV-exposed children for 18 months after birth during 2015-2017 were collected from the Management Information System of China’s Prevention of Mother-to-Child Transmission of HIV for a retrospective analysis. The EID test characteristics of HIV exposed children and associated factors were analyzed.@*Results@#From 2015 to 2017, the EID test rate in HIV exposed children increased from 65.6% to 83.4% in China (trend χ2 P<0.001). The EID test rate within 8 weeks after birth increased from 61.1% to 76.8% (trend χ2 P<0.001), but the EID positive rate decreased from 8.7% to 3.4% (trend χ2 P<0.001). The EID positive rate in fatal HIV-exposed children was 47.7%, 36.9% and 36.3% during 2015-2017, respectively, the differences were not significant. EID test rate was associated with ethnic group, living area, survival status and the year reaching 18-month-old of the children.@*Conclusions@#The performance of EID test has been standardized step by step in China. The positive rate of EID test decreased gradually with year. However, the EID test rates in children who were from minority ethnic groups, lived in areas with lower prevalence of HIV infection and died within 18 months after birth were relatively low.