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1.
An. bras. dermatol ; 91(1): 64-72, Jan.-Feb. 2016. tab
Article in English | LILACS | ID: lil-776436

ABSTRACT

Abstract The number of studies on patch-test results in children and adolescents has gradually increased in recent years, thus stimulating reviews. This paper is a systematic review of a 15-year period devoted to studying the issue. Variations pertaining to the number and age groups of tested children and/or adolescents, the number of subjects with atopy/atopic dermatitis history, the quantity, type and concentrations of the tested substances, the test technique and type of data regarding clinical relevance, must all be considered in evaluating these studies, as they make it harder to formulate conclusions. The most common allergens in children were nickel, thimerosal, cobalt, fragrance, lanolin and neomycin. In adolescents, they were nickel, thimerosal, cobalt, fragrance, potassium dichromate, and Myroxylon pereirae. Knowledge of this matter aids health professionals in planning preventive programs aimed at improving children's quality of life and ensuring that their future prospects are not undermined.


Subject(s)
Adolescent , Child , Female , Humans , Male , Allergens , Dermatitis, Allergic Contact/diagnosis , Patch Tests/statistics & numerical data , Age Factors , Dermatitis, Atopic/diagnosis , Patch Tests/methods , Sex Factors , Time Factors
2.
Chinese Journal of Medical Aesthetics and Cosmetology ; (6)2002.
Article in Chinese | WPRIM | ID: wpr-537839

ABSTRACT

Objective To study the characteristics of cosmetic dermatosis and to determine the allergens for cosmetic dermatosis. Methods Unwanted effects of cosmetics in the 989 patients were observed and the patch test was performed in all patients with Bianmin standard screening patch test kit. Results Of them 698 (70.58 %) were contact dermatitis, 109 (11.02 %) were hyperpigmentation, and 79 (7.99 %) were acne like lesions. One hundred and eighty-nine kinds of cosmetics were suspected to be responsible for the dermatosis. 653 out of 989 patients tested were positive (66.03%). Conclusions Cosmetic dermatosis such as contact dermatitis and hyperpigmentation can be prevented and cured by guidance of patch test. The patch test should be performed in patients with cosmetic dermatosis.

3.
Chinese Journal of Dermatology ; (12)1994.
Article in Chinese | WPRIM | ID: wpr-524953

ABSTRACT

Objective To study the role of photoallergens and contact allergens in the pathogenesis of chronic actinic dermatitis (CAD).Methods Ba sed on the standard procedures of photopatch test recommended by the British Pho todermatology Group (BPG) and the routine procedures of patch test,photopatch a nd patch tests were performed on 56 patients with CAD,42 patients with polymorp hous light eruption (PLE) and 25 patients with chronic eczema on scalp and face by standard photopatch test series recommended by the International Contact Derm atitis Research Group (ICDRG) and home-made standard series of contact allerge ns.A set of ten Philips TL20W/09N tubes was used as the source of irradiation.Results In the 56 CAD patients,the positive rates were 46.43 %,57.14 % and 32.14% for photopatch test,patch test and both tests,respectively,which appea red to be significantly higher than those in the patients with PLE.Positive pa tch reactions were found in 65% of the patients with chronic eczema,which was s imilar to that of CAD.And the frequency of the positive allergens in chronic ec zema was the same as that in CAD,in which fragrance mixture (FM) ranked the fir st,followed by balsam of Peru (BOP),cobalt chloride,nickel sulphate.In CAD,FM and BOP were the most common allergens and photoallergens,which accounted fo r 44% and 32% of the positive reactions in patch tests,15.38% and 17.95% in pho topatch tests,respectively.Conclusions Both photoallergens and contact aller gens may play important roles in the pathogenesis of CAD.Allergens positive in patch tests and photopatch tests and related compounds which can cause cross-r eactivity with the above allergens should be avoided by the patients with CAD.

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