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Objective To evaluate the expressions and prognostic significance of phosphorylation of protein kinase B1 (pAkt1) and human telomere reverse transcriptase (hTERT) in epithelial ovarian carcinoma.Methods The expressions of pAkt1 and hTERT were examined by immunohistochemical SP method in 72 cases of epithelial ovarian carcinoma and 10 normal endometrial tissues to analyze the correlation between pAkt1 and hTERT and their relationships with clinic-pathological features and prognosis.Results The positive expression rate of pAkt1 in epithelial ovarian carcinoma was 73.6％,and the positive expression rate of hTERT was 56.9％,compared with normal ovarian tissues,with statistical significance (x2 =20.814,P ＜ 0.001;x2 =11.3g9,P ＜ 0.001).The expression of pAkt1 was not associated with hTERT expression (r =0.075,P =0.532) in epithelial ovarian carcinoma.The expressions of pAkt1 and hTERT in epithelial ovarian carcinoma were correlated with tumor differentiation status (x2=6.475,P =0.011;x2 =1.370,P =0.001).The disease-free survival of patients with pAkt1 and hTERT positive coexpression was significantly shorter than others (8.585 months vs.11.227 months,x2 =4.361,P =0.037),but there was no significant difference in overall survival (11.107 months:11.695 months,x2 =0.394,P =0.530).Conclusion pAkt1 and hTERT are highly expressed in epithelial ovarian carcinoma,and high coexpression of pAkt1 and hTERT indicates poor prognosis in epithelial ovarian carcinoma.
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A novel built-in-self-test (BIST) method called seeded autonomous cyclic shift register (SACSR) is presented to reduce test power of the sequential circuit. The key idea is to use a pseudorandom pattern generator and several XOR gates to generate seeds that share fewer test vectors. The generated seed is taken XOR operation with a cyclic shift register, and the single input change (SIC) sequence is generated. The proposed scheme is easily implemented and can reduce the switching activities of the circuit under test (CUT) greatly. Experimental results on ISCAS89 benchmarks show that on average more than 63% power reduction can be achieved. It also demonstrates that the generated test vectors attain high fault coverage for stuck-at fault and transition fault coverage with short test length.