External pixe – A novel approach for determining trace elements in fermentation process.
Article
in English
| IMSEAR
| ID: sea-157683
ABSTRACT
External Particle Induced X-ray Emission technique was employed in the study of submerged fermentation of ethanol from Jaggery using Saccharomyces cerevisiae as the organism. Effect of KNO3 as a nitrogen source was studied and the uptake of the supplement was monitored. A Proton beam of 3MeV from the 3MV Tandom type pelletron accelerator was used for the multi-elemental analysis. Apart from K, other elements like Cr, Fe, Cu and Zn were identified. The sensitivity of the technique was also determined by varying the sample size between 2mm and 10mm.
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Index:
IMSEAR (South-East Asia)
Language:
English
Year:
2010
Type:
Article
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