Neurobehavioral Effects of Low Level Lead-exposed Workers at CRT(Cathode Ray Tube) Manufacturing Factory / 대한산업의학회지
Korean Journal of Occupational and Environmental Medicine
;
: 208-216, 1997.
Article
in Korean
| WPRIM
| ID: wpr-200277
ABSTRACT
To assess neurobehavioral effects of 48 low level lead-exposed workers in CRT manufacturing factory, simple and choice reaction time test with NTOS (Neurobehavioral Tests for Occupational Screening), digit symbol and digit span with K-WAIS (Korean Wechsler Adult Intelligence Scale), and SCL-90-R (Symptom Check List 90 revised) was examined. These screening test battery reflect 3 psychological domain; psychomotor, short term memory, and symptom. Average blood lead level was 17.7 microgram/dl and mean exposure duration was 5.6 years. Nobody exceeded blood lead level over 40 microgram/dl, the guideline. We divided workers to two group, shorts-term exposed group(< or = 5 years) and long-term exposed groups 5 years) for analysis. ANCOVA model of simple reaction time, hostility, phobic anxiety, somatization were statistically significant and coefficient of independent variable of exposure duration was also significant. MANCOVA model of SCL-90-R was significant, too. The results of this study were consistent with previous study; symptoms were early neurobehavioral effects of low level lead exposure. And this study showed that current blood lead level as independent variable was able to mask the early neurobehavioral effects.
Full text:
Available
Index:
WPRIM (Western Pacific)
Main subject:
Anxiety
/
Reaction Time
/
Mass Screening
/
Hostility
/
Intelligence
/
Masks
/
Memory
Type of study:
Controlled clinical trial
/
Prognostic study
/
Screening study
Limits:
Adult
/
Humans
Language:
Korean
Journal:
Korean Journal of Occupational and Environmental Medicine
Year:
1997
Type:
Article
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