Influence of prior 810-nm-diode intracanal laser irradiation on hydrophilic resin-based sealer obturation
Braz. oral res
; 26(4): 323-329, July-Aug. 2012. ilus, tab
Article
en En
| LILACS
| ID: lil-640717
Biblioteca responsable:
BR1.1
ABSTRACT
Dentin wall structural changes caused by 810-nm-diode laser irradiation can influence the sealing ability of endodontic sealers. The objective of this study was to evaluate the apical leakage of AH Plus and RealSeal resin-based sealers with and without prior diode laser irradiation. Fifty-two single-rooted mandibular premolars were prepared and divided into 4 groups, according to the endodontic sealer used and the use or non-use of laser irradiation. The protocol for laser irradiation was 2.5W, continuous wave in scanning mode, with 4 exposures per tooth. After sample preparation, apical leakage of 50% ammoniacal silver nitrate impregnation was analyzed. When the teeth were not exposed to irradiation, the RealSeal sealer achieved the highest scores, showing the least leakage, with significant differences at the 5% level (Kruskal-Wallis test, p = 0.0004), compared with AH Plus. When the teeth were exposed to the 810-nm-diode laser irradiation, the sealing ability of AH Plus sealer was improved (p = 0282). In the RealSeal groups, the intracanal laser irradiation did not interfere with the leakage index, showing similar results in the GRS and GRSd groups (p = 0.1009).
Palabras clave
Texto completo:
1
Índice:
LILACS
Asunto principal:
Materiales de Obturación del Conducto Radicular
/
Filtración Dental
/
Láseres de Semiconductores
Tipo de estudio:
Clinical_trials
Límite:
Humans
Idioma:
En
Revista:
Braz. oral res
Asunto de la revista:
ODONTOLOGIA
Año:
2012
Tipo del documento:
Article