Evaluation of Structural and Compositional Changes on the Root Surface Exposed to Diode Laser (810 nm): An In?vitro Study

Jayachandran, Dorairaj; Selvaraj, Sunantha; Priya, Shanmuga; Kukkamalla, Meena A.; Senkalvarayan, Vaishnavi.

Article | IMSEAR | ID: sea-222451

Palabras clave

Stylus profilometer; scanning electron microscopy (SEM); energy?dispersive X?ray analysis (EDAX); compositional changes; ultrastructural changes

Texto completo: 1 Índice: IMSEAR Año: 2023 Tipo del documento: Article

Texto completo: 1 Índice: IMSEAR Año: 2023 Tipo del documento: Article