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Scanning Electron Microscopic Findings of Removed Supramid Extra II(R) from Recurred Congenital Ptosis Patients
Journal of the Korean Ophthalmological Society ; : 363-368, 2002.
Artículo en Coreano | WPRIM | ID: wpr-93617
ABSTRACT

PURPOSE:

To identify the cause of frequent recurrence of ptosis after frontalis suspension with Supramid Extra II(R), we investigated the change occurring in the Supramid following implantation.

METHODS:

We examined the removed Supramid Extra II(R) from recurred congenital ptosis by scanning electron microscopy.

RESULTS:

Some cracks were noted on its sheath as well as hydrolytic remnant of internal polyfilament. In most cases, the longer the implantation time was, the more the sign of disintegration was observed.

CONCLUSIONS:

This study showed that hydrolysis and subsequent weakening of Supramid material might have caused the frequent recurrence of ptosis.
Asunto(s)

Texto completo: Disponible Índice: WPRIM (Pacífico Occidental) Asunto principal: Recurrencia / Microscopía Electrónica de Rastreo / Hidrólisis / Nylons Tipo de estudio: Estudio diagnóstico Límite: Humanos Idioma: Coreano Revista: Journal of the Korean Ophthalmological Society Año: 2002 Tipo del documento: Artículo

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Texto completo: Disponible Índice: WPRIM (Pacífico Occidental) Asunto principal: Recurrencia / Microscopía Electrónica de Rastreo / Hidrólisis / Nylons Tipo de estudio: Estudio diagnóstico Límite: Humanos Idioma: Coreano Revista: Journal of the Korean Ophthalmological Society Año: 2002 Tipo del documento: Artículo