A new occlusive patch test system comparable to IQ and Finn chambers.
Indian J Dermatol Venereol Leprol
;
2014 Jul-Aug; 80(4): 291-295
Artigo
em Inglês
| IMSEAR
| ID: sea-154839
ABSTRACT
Background:
A good patch test system should have good adhesion and contact, and minimal leakage; Finn and IQ patch test system have these properties but are expensive.Aims:
To develop a new cost‑effective occlusive patch test system that had good contact with the skin and was non‑irritant.Methods:
The system (designated Chamber X) was fabricated using a semi‑permeable tape and a flexible virgin plastic chamber. Chamber X was developed by (i) selecting adhesive tape based on its non irritancy and adhesive potential (ii) testing plastic chamber material for its skin irritancy (iii) testing the assembled system against Finn, IQ and locally available chambers for irritancy, contact, leakage and occlusivity.Results:
Chamber X showed better occlusion than IQ, Finn and locally available chambers and was comparable to, (P > 0.05) IQ and Finn in terms of irritancy, contact and leakage.Conclusions:
The results demonstrate that the Chamber X offers a cost effective patch test system comparable to IQ and Finn chambers in terms of safety, adhesion, leakage and occlusivity.
Texto completo:
DisponíveL
Índice:
IMSEAR (Sudeste Asiático)
Assunto principal:
Pele
/
Humanos
/
Testes do Emplastro
/
Alérgenos
/
Dermatite Alérgica de Contato
/
Desenho de Equipamento
/
Irritantes
Idioma:
Inglês
Revista:
Indian J Dermatol Venereol Leprol
Ano de publicação:
2014
Tipo de documento:
Artigo
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