Scanning Electron Microscopic Findings of Removed Supramid Extra II(R) from Recurred Congenital Ptosis Patients
Journal of the Korean Ophthalmological Society
; : 363-368, 2002.
Article
em Ko
| WPRIM
| ID: wpr-93617
Biblioteca responsável:
WPRO
ABSTRACT
PURPOSE: To identify the cause of frequent recurrence of ptosis after frontalis suspension with Supramid Extra II(R), we investigated the change occurring in the Supramid following implantation. METHODS: We examined the removed Supramid Extra II(R) from recurred congenital ptosis by scanning electron microscopy. RESULTS: Some cracks were noted on its sheath as well as hydrolytic remnant of internal polyfilament. In most cases, the longer the implantation time was, the more the sign of disintegration was observed. CONCLUSIONS: This study showed that hydrolysis and subsequent weakening of Supramid material might have caused the frequent recurrence of ptosis.
Palavras-chave
Texto completo:
1
Índice:
WPRIM
Assunto principal:
Recidiva
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Microscopia Eletrônica de Varredura
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Hidrólise
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Nylons
Tipo de estudo:
Diagnostic_studies
Limite:
Humans
Idioma:
Ko
Revista:
Journal of the Korean Ophthalmological Society
Ano de publicação:
2002
Tipo de documento:
Article