70th Annual Denver X-ray Conference Report: A Virtual Event

ABSTRACT

Materials Identification Quantitative Phase Analysis Advanced PDF Modelling EDS Detectors Sample Preparation of XRF Basic XRF Trace Analysis Layered Structures Intermediate to Advanced XRD Imaging Micro XRF Non-ambient XRD Quantitative Analysis of XRF Handheld XRF III. New Developments in XRD and XRF Instrumentation Quantitative Phase Analysis Advanced Total Scattering Methods for Complex Material Studies Quantitative Analysis of XRF Trace Analysis including TXRF Machine Learning Techniques in X-ray Analysis General XRD Imaging Stress Analysis Functional Materials General XRF Non-ambient Analysis X-ray Absorption Spectroscopy Industrial Applications of XRD and XRF Cultural Heritage V. POSTER SESSIONS Both XRD and XRF Posters were available on the first day of the conference. Residual Stress and Microstructural Analysis of Laser Powder Bed Fusion Processed Ti-5Al-5V-5Mo-3Cr Alloy Using Synchrotron X-ray Diffraction C. XRF best poster award M. Sunder*, M.A. Zaitz, IBM, USA, for their work Andrés Servando Aguirre Sánchez, Instituto Tecnológico y de Estudios Superiores de Monterrey, Mexico Adam Corrao, Stony Brook University, USA Hannah Cross, Keele University, United Kingdom Samantha Davies, Cranfield University, United Kingdom Benedikt Eger, Bonn-Rhein-Sieg University of Applied Sciences, Germany Gesa Goetzke, TU Berlin, Germany Sarah Gosling, Cranfield University, United Kingdom Sven Hampel, Clausthal University of Technology, Germany Benjamin Hulbert, University of Illinois at Urbana-Champaign, USA Rahul Lalge, University of Minnesota, USA Marcelo Augusto Malagutti, Universidade Federal de Santa Catarina, Brazil Otavio Jovino Marques, Illinois Institute of Technology, USA Ana Cecilia Murrieta Muñoz, Tecnológico de Monterrey, Mexico Steffen Staeck, TU Berlin, Germany VIII.