Classification of COVID-19 Disease Severity using CT Scans via Deep Convolutional Neural Networks
2022 IEEE International Conference on Electro Information Technology, eIT 2022
; 2022-May:401-404, 2022.
Article
in English
| Scopus | ID: covidwho-1961374
ABSTRACT
The respiratory virus Acute Respiratory Syndrome Coronavirus 2 (SARS-CoV-2), commonly known as COVID-19, has caused wide concern and a need to be able to accurately determine its effects on individual lung capacities. Computerized Tomography (CT) scans were chosen as the main datatype for determining whether a patient had COVID-19 or had normal lung capacities. The rationale is that there is an inherent lack of CT scan experts, especially in counties with low socio-economic status (SES). Thus, an automated and objective artificially intelligent (AI) algorithm can assist in the hope to provide more efficacious use CT scans for classification of COVID-19 and monitoring of disease progression. In this study, a wide variety of CT scans with different formats were tested to determine the best approach for binary classification models using deep learning (DL) techniques. A total of three publicly available COVID-19 datasets were tested using a 2-dimensional and a 3-dimensional algorithm, where each dataset had its own subsets and unique parameters. A finalized version of the 3-dimensional model was shown to achieve a high accuracy, precision, sensitivity, and F1 Score of 86.6% each. The developed method provides an objective measure to automatically classify COVID-19 patients from CT scans © 2022 IEEE.
Automated classification; COVID-19; CT scan; Deep learning; SARS-CoV-2.; Biological organs; Computerized tomography; Convolutional neural networks; Deep neural networks; Economics; Computerized tomography scan; Convolutional neural network; Coronaviruses; Datatypes; Disease severity; Intelligent Algorithms; Socio-economic status; Coronavirus
Full text:
Available
Collection:
Databases of international organizations
Database:
Scopus
Type of study:
Prognostic study
Language:
English
Journal:
2022 IEEE International Conference on Electro Information Technology, eIT 2022
Year:
2022
Document Type:
Article
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