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1.
A quantitative structural characterisation of active semiconducting materials (mSi; SiO2; Al2O3; TiO2) for use in printed electronics using a combination of Small Angle Light Scattering (SALS) and Ultra Small Angle X-ray Scattering (USAXS).
Nanotechnology
; 31(46): 465703, 2020 Nov 13.
Artículo
en Inglés
| MEDLINE | ID: mdl-32756026
2.
Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy.
J Synchrotron Radiat
; 24(Pt 5): 1017-1023, 2017 Sep 01.
Artículo
en Inglés
| MEDLINE | ID: mdl-28862625
3.
Investigation of surface topology of printed nanoparticle layers using wide-angle low-Q scattering.
J Synchrotron Radiat
; 21(Pt 3): 547-53, 2014 May.
Artículo
en Inglés
| MEDLINE | ID: mdl-24763644
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