ABSTRACT
By monitoring the reflectance of a sample surface during deposition of a thin organic film, one can obtain information with submonolayer resolution in real-time. A special kind of optical spectroscopy is Differential Reflectance Spectroscopy (DRS), which compares the reflectance before and during deposition of a thin film or any other change of the surface optical properties. In this work, we present an extended DRS setup that allows monitoring simultaneously both linear polarization states (s and p) of the reflected light. We implement polarization-dependent DRS to monitor the growth of perflouropentacene thin films on a Ag(110) single crystal. The setup allows us to deduce the optical anisotropy of the sample and, in particular, the preferred orientation of the molecules on the surface.
