Infrared optical constants and roughness factor functions determination: the H(T)H(R)TR method.

This method was developed to determine the complex infrared optical constant of a single free-standing partially absorbing plate as wellas a thin solid film eposited on it. The method is based on exact formulas for normal transmittance T and near-normal reflectance R of the substrate as well as the film-substrate double layer. Coherent multiple reflections throughout the film and incoherent multiple reflections in the substrate as well as the intensity losses on the rough surface are taken into account. The influence of various data on the solution of the inverse problem is discussed by a contour map study. The method is explained using examples of both- and single-side-polished silicon wafers where the transmission and reflection roughness factor functions H(T),H(R) are determined for the rough surface. The thin-film example has been the silicon oxide film formed on the single-side-polished silicon substrate by chemical vapor deposition.

[Basic principles and trends in the intensive therapy of severe forms of alcoholic delirium]. / Osnovnye printsipy i napravleniia intensivnoi terapii tiazhelykh form alkogol'nogo deliriia

The paper presents therapeutical results of 105 patients with severe forms of alcoholic delirium who were treated by intensive therapeutical methods in a specialized department. The main trends of the intensive therapy were the following: discontinuation of psychomotor excitation and general hyperkinesia, the treatment of respiration disturbances and massive infusion therapy. As a result, in 87 patients of 105 the psychotic condition was ceasted 12--24 hours after the beginning of the treatment.