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1.
Location of ion-induced surface Auger decay processes from scattered-ion measurements.
Hird B; Armstrong RA; Gauthier P; Seel JA.
Phys Rev B Condens Matter ; 54(19): 14146-14152, 1996 Nov 15.
Article in English | MEDLINE | ID: mdl-9985339
2.
Charge-state distributions of scattered and recoil ions in C+-, F+-, and Ne+-Si-surface collisions.
Hird B; Armstrong RA; Gauthier P.
Phys Rev A ; 49(2): 1107-1114, 1994 Feb.
Article in English | MEDLINE | ID: mdl-9910340
3.
Multiply ionized atom production in keV-N+-Si-surface scattering.
Hird B; Armstrong RA; Gauthier P.
Phys Rev B Condens Matter ; 48(6): 3654-3660, 1993 Aug 01.
Article in English | MEDLINE | ID: mdl-10008811
4.
Beam charge dependence of ion-surface scattering.
Hird B; Gauthier P; Bulicz J; Armstrong RA.
Phys Rev Lett ; 67(25): 3575-3577, 1991 Dec 16.
Article in English | MEDLINE | ID: mdl-10044770
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