The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250-5000 ev: a theory/experiment comparison.

The secondary electron (SE) yield, delta, was measured from 24 different elements at low primary beam energy (250-5,000 eV). Surface contamination affects the intensity of delta but not its variation with primary electron energy. The experiments suggest that the mean free path of SEs varies across the d bands of transition metals in agreement with theory. Monte Carlo simulations suggest that surface plasmons may need to be included for improved agreement with experiment.

Theory experiment comparison of the electron backscattering factor from solids at low electron energy (250-5,000 eV).

The electron backscattering factor was measured from 24 different elements at low primary beam energy (250-5,000 eV). The results were compared with Monte Carlo simulations from a variety of freely available programs and an in-house developed program. The results suggest that a thin film of oxide can modify the backscattering factor at low primary energy. In addition, a number of problems have been identified with the freely available programs.