ABSTRACT
We present an optical model implemented in the commercial software SETFOS 4.6 for simulating perovskite/silicon monolithic tandem solar cells that exploit light scattering structures. In a first step we validate the model with experimental data of tandem solar cells that either use front- or rear-side textures and extract the internal quantum efficiency of the methyl-ammonium lead iodide (MALI) perovskite sub-cell. In a next step, the software is used to investigate the potential of different device architectures featuring a monolithic integration between the perovskite and silicon sub-cells and exploiting rear- as well as front-side textures for improved light harvesting. We find that, considering the available contact materials, the p-i-n solar cell architecture is the most promising with respect to achievable photocurrent for both flat and textured wafers. Finally, cesium-formamidinium-based perovskite materials with several bandgaps were synthetized, optically characterized and their potential in a tandem device was quantified by simulations. For the simulated layer stack and among the tested materials with bandgaps of 1.7 and 1.6 eV, the one with 1.6 eV bandgap was found to be the most promising, with a potential of reaching a power conversion efficiency of 31%. In order to achieve higher efficiencies using higher band-gap materials, parasitic absorptance in the blue spectral range should be further reduced.
ABSTRACT
We apply a Fourier-scattering model to describe light scattering in solar cells with textured surfaces. For the size and inclination angle of typical micro-textures, scattering may occur into large angles. This makes the model prone to paraxial errors. We present a non-paraxial formulation and discuss the transition from the domain of refraction at large facets to scattering at small features.
ABSTRACT
Using rigorous diffraction theory we investigate the scattering properties of various random textures currently used for photon management in thin-film solar cells. We relate the haze and the angularly resolved scattering function of these cells to the enhancement of light absorption. A simple criterion is derived that provides an explanation why certain textures operate more beneficially than others. Using this criterion we propose a generic surface profile that outperforms the available substrates. This work facilitates the understanding of the effect of randomly textured surfaces and provides guidelines towards their optimization.
ABSTRACT
The electrical properties of vertically aligned silicon nanowires doped by ion implantation are studied in this paper by a combination of electron beam-induced current imaging and two terminal current-voltage measurements. By varying the implantation parameters in several process steps, uniform p- and n-doping profiles as well as p-n junctions along the nanowire axis are realized. The effective doping is demonstrated by electron beam-induced current imaging on single nanowires, and current-voltage measurements show their well-defined rectifying behavior.
ABSTRACT
Atomic force microscopy (AFM) can be used to image cross-sections of thin-film samples. So far, however, it has mainly been used to study cross-sections of epitaxial systems or integrated circuits on crystalline substrates. In this paper, we show that AFM is a powerful tool to image fractured cross-sections of polycrystalline thin films deposited on crystalline and non-crystalline substrates, yielding unique information on the three-dimensional properties of the cross-sections, with a spatial resolution in the nm range. Original images of three different heterostructure systems are presented: Si(wafer)/SnO2/CdS/CdTe, glass/Mo/Cu(In,Ga)Se2,/CdS/ZnO, and glass/SnO2/WO3. We discuss the results by comparing AFM and scanning electron microscopy (SEM) images, and explain, for the different materials, why the AFM provides useful additional information.
