Magnetic force microscopy of an operational spin nano-oscillator.

Magnetic force microscopy (MFM) is a powerful technique for studying magnetic microstructures and nanostructures that relies on force detection by a cantilever with a magnetic tip. The detected magnetic tip interactions are used to reconstruct the magnetic structure of the sample surface. Here, we demonstrate a new method using MFM for probing the spatial profile of an operational nanoscale spintronic device, the spin Hall nano-oscillator (SHNO), which generates high-intensity spin wave auto-oscillations enabling novel microwave applications in magnonics and neuromorphic computing. We developed an MFM system by adding a microwave probe station to allow electrical and microwave characterization up to 40 GHz during the MFM process. SHNOs-based on NiFe/Pt bilayers with a specific design compatible with the developed system-were fabricated and scanned using a Co magnetic force microscopy tip with 10 nm spatial MFM resolution, while a DC current sufficient to induce auto-oscillation flowed. Our results show that this developed method provides a promising path for the characterization and nanoscale magnetic field imaging of operational nano-oscillators.

Microwave probe stations with three-dimensional control of the magnetic field to study high-frequency dynamics in nanoscale devices.

We present two microwave probe stations with motorized rotary stages for adjusting the magnitude and angle of the applied magnetic field. In the first system, the magnetic field is provided by an electromagnet and can be adjusted from 0 to ∼1.4 T while its polar angle (θ) can be varied from 0° to 360°. In the second system, the magnetic field is provided by a Halbach array permanent magnet, which can be rotated and translated to cover the full range of polar (θ) and azimuthal (φ) angles with a tunable field magnitude up to ∼1 T. Both systems are equipped with microwave probes, bias-Ts, amplifiers, and spectrum analyzers to allow for microwave characterization up to 40 GHz, as well as software to automatically perform continuous large sets of electrical and microwave measurements.

Order of magnitude improvement of nano-contact spin torque nano-oscillator performance.

Spin torque nano-oscillators (STNO) represent a unique class of nano-scale microwave signal generators and offer a combination of intriguing properties, such as nano sized footprint, ultrafast modulation rates, and highly tunable microwave frequencies from 100 MHz to close to 100 GHz. However, their low output power and relatively high threshold current still limit their applicability and must be improved. In this study, we investigate the influence of the bottom Cu electrode thickness (tCu) in nano-contact STNOs based on Co/Cu/NiFe GMR stacks and with nano-contact diameters ranging from 60 to 500 nm. Increasing tCu from 10 to 70 nm results in a 40% reduction of the threshold current, an order of magnitude higher microwave output power, and close to two orders of magnitude better power conversion efficiency. Numerical simulations of the current distribution suggest that these dramatic improvements originate from a strongly reduced lateral current spread in the magneto-dynamically active region.