pH dependence of uranyl retention in a quartz/solution system: an XPS study.

We have investigated the pH dependence of U(VI) retention in quartz/10(-4) M uranyl solution systems, under conditions favoring formation of polynuclear aqueous species and of colloids of amorphous schoepite as U(VI) solubility-limiting phases. X-ray photoelectron spectroscopy was used to gain insights into the coordination environments of sorbed/precipitated uranyl ions in the centrifuged quartz samples. The U4f XPS spectra made it possible to identify unambiguously the presence of two uranyl components. A high binding energy component, whose relative proportion increases with pH, exhibits the U4f lines characteristic of a reference synthetic metaschoepite. Such a high binding energy component is interpreted as a component having a U(VI) oxide hydrate character, either as polynuclear surface oligomers and/or as amorphous schoepite-like (surface) precipitates. Its pH dependence suggests that a binding of polynuclear species at quartz surfaces and/or a formation of amorphous schoepite-like (surface) precipitates is favored when the proportion of aqueous polynuclear species increases. A second surface component exhibits binding energies for the U4f core levels at values significantly lower (DeltaE(b)=1.2 eV) than for metaschoepite, evidencing uranyl ions in a distinct coordination environment. Such a low binding energy component may be attributed to monomeric uranyl surface complexes on the basis of published EXAFS data. Such a hypothesis is supported by a major contribution of the low binding energy component to the U4f XPS spectra of reference samples for uranyl sorbed on quartz from very acidic 10(-3) M uranyl solutions where UO(2)(2+) ions predominate.

Chemical bonds broken in latent tracks of light ions in plastic track detectors.

When a swift ion is slowed down through a plastic detector it creates a latent track. In nuclear track detectors, this latent track can be specifically etched by an appropriate chemical solution. This enlargement process is due to a higher etch velocity (VT) along the ion's path than in the non-damaged part of the detector. The etched track velocity is definitely linked to the damage created by the incoming ion in the detector material. A relationship between the physical parameters of the energy deposition and the variation in this etched track velocity with the ion energy cannot easily be explained. We present here our study on the chemical damage created by several ions in a cellulose nitrate type detector and our first attempt to simulate them by the use of the hit theory.