Evolving information complexity of coarsening materials microstructures.

The temporal evolution of microstructural features in metals and ceramics has been the subject of intense investigation over many years because deviations from normal grain growth behavior are ubiquitous and strongly dictate observed mechanical and magnetic properties. To distinguish among different grain growth scenarios, we examine the time evolution of the information content of both synthetic and experimental coarsening microstructures as quantified by both a computable information density (CID) and a spectral entropy along with selected metrics and measures of shared information and interaction strength. In these approaches, microstructural evolution is described in terms of two time series representations, namely: (1) strings and their compressed counterparts that reflect the information contained in the configuration of a system over time, and (2) the spectra of graph Laplacians that embody the information contained in a coarsening grain network. These approaches permit one to characterize dynamically evolving microstructures and to identify correlation times associated with different coarsening scenarios. Moreover, as the information content of a system is a proxy for the entropy, a thermodynamic description of grain growth is also described.

Kinetics of first-order phase transitions with correlated nuclei.

We demonstrate that the time evolution of a first-order phase transition may be described quite generally in terms of the statistics of point processes, thereby providing an intuitive framework for visualizing transition kinetics. A number of attractive and repulsive nucleation scenarios is examined followed by isotropic domain growth at a constant rate This description holds for both uncorrelated and correlated nuclei, and may be employed to calculate the nonequilibrium, n-point spatiotemporal correlations that characterize the transition. Furthermore, it is shown that the interpretation of the one-point function in terms of a stretched-exponential, Kolmogorov-Johnson-Mehl-Avrami result is problematic in the case of correlated nuclei, but that the calculation of higher-order correlation functions permits one to distinguish among various nucleation scenarios.

Inspired by nature: investigating tetrataenite for permanent magnet applications.

Chemically ordered L10-type FeNi, also known as tetrataenite, is under investigation as a rare-earth-free advanced permanent magnet. Correlations between crystal structure, microstructure and magnetic properties of naturally occurring tetrataenite with a slightly Fe-rich composition (~ Fe55Ni44) obtained from the meteorite NWA 6259 are reported and augmented with computationally derived results. The tetrataenite microstructure exhibits three mutually orthogonal crystallographic variants of the L10 structure that reduce its remanence; nonetheless, even in its highly unoptimized state tetrataenite provides a room-temperature coercivity of 95.5 kA m(-1) (1200 Oe), a Curie temperature of at least 830 K and a largely temperature-independent anisotropy that preliminarily point to a theoretical magnetic energy product exceeding (BH)max = 335 kJ m(-3) (42 MG Oe) and approaching those found in today's best rare-earth-based magnets.

Grain boundary character distribution of nanocrystalline Cu thin films using stereological analysis of transmission electron microscope orientation maps.

Stereological analysis has been coupled with transmission electron microscope (TEM) orientation mapping to investigate the grain boundary character distribution in nanocrystalline copper thin films. The use of the nanosized (<5 nm) beam in the TEM for collecting spot diffraction patterns renders an order of magnitude improvement in spatial resolution compared to the analysis of electron backscatter diffraction patterns in the scanning electron microscope. Electron beam precession is used to reduce dynamical effects and increase the reliability of orientation solutions. The misorientation distribution function shows a strong misorientation texture with a peak at 60°/[111], corresponding to the Σ3 misorientation. The grain boundary plane distribution shows {111} as the most frequently occurring plane, indicating a significant population of coherent twin boundaries. This study demonstrates the use of nanoscale orientation mapping in the TEM to quantify the five-parameter grain boundary distribution in nanocrystalline materials.

Effect of downscaling nano-copper interconnects on the microstructure revealed by high resolution TEM-orientation-mapping.

In this work, a recently developed electron diffraction technique called diffraction scanning transmission electron microscopy (D-STEM) is coupled with precession electron microscopy to obtain quantitative local texture information in damascene copper interconnects (1.8 µm-70 nm in width) with a spatial resolution of less than 5 nm. Misorientation and trace analysis is performed to investigate the grain boundary distribution in these lines. The results reveal strong variations in texture and grain boundary distribution of the copper lines upon downscaling. Lines of width 1.8 µm exhibit a strong <111> normal texture and comprise large micron-size grains. Upon downscaling to 180 nm, a {111}<110> bi-axial texture has been observed. In contrast, narrower lines of widths 120 and 70 nm reveal sidewall growth of {111} grains and a dominant <110> normal texture. The microstructure in these lines comprises clusters of small grains separated by high angle boundaries in the vicinity of large grains. The fraction of coherent twin boundaries also reduces with decreasing line width.

Low-magnification Quantitative X-ray Mapping of Grain-boundary Segregation in Aluminum-4 wt.% Copper by Analytical Electron Microscopy.

: Quantitative X-ray mapping in the analytical electron microscope (AEM) could improve the statistics of grain-boundary segregation measurements if high spatial resolution can be maintained at lower magnifications (<500 kX). Typically, only about 10 boundaries are analyzed because of the difficulty of conventional AEM measurements; however, a low-magnification quantitative X-ray map could contain twice this number of boundaries in a single field of view. Microscope conditions and mapping parameters have been explored for operation at approximately 250 kX, under a variety of conditions to illustrate the trade-offs between various characteristics, such as analytical resolution, counting statistics, magnification, and acquisition time. From these data, it is possible to extrapolate to maps generated under different conditions and estimate their limitations with respect to these characteristics. A simple model has been developed to describe the behavior of inclined grain boundaries that can be used to estimate the detectability of segregant as a function of boundary tilt. Using quantitative X-ray maps, grain boundary Cu coverage has been measured from 55 boundaries in Al-4 wt.% Cu with minimal user effort. For fine-grained thin films, mapping is substantially more efficient than other methods of data acquisition and may be used to measure segregation at large numbers of boundaries.

The preparation of cross-sectional transmission electron microscopy specimens of Nb/Al multilayer thin films on sapphire substrates.

We have developed a technique for preparation of cross-sectional transmission electron microscopy samples of reacted and unreacted Nb/Al multilayer thin films on sapphire substrates. The choice of substrate was found to be extremely important. Sapphire sputters more slowly than Nb and Nb-compounds and therefore makes it possible to obtain the electron transparent regions in the thin films rather than in the substrate. However, the brittle nature of the sapphire restricts the types of thinning techniques that can be used, requiring extensive ion thinning as a final stage.