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1.
Opt Express ; 26(2): 2160-2167, 2018 Jan 22.
Article in English | MEDLINE | ID: mdl-29401940

ABSTRACT

We have developed an InAs/InP quantum dot (QD) C-band coherent comb laser (CCL) module with actively stabilized absolute wavelength and power, and channel spacing of 34.462 GHz with ± 100 ppm accuracy. The total output power is up to 46 mW. The integrated average relative intensity noise (RIN) values of the lasing spectrum and a filtered single channel at 1540.19 nm were -165.6 dB/Hz and -130.3 dB/Hz respectively in the frequency range from 10 MHz to 10 GHz. The optical linewidth of the 45 filtered individual channels between 1531.77 nm to 1543.77 nm ranged from 850 kHz to 2.16 MHz. We have also analyzed the noise behaviors of each individual channel.

2.
Opt Lett ; 37(6): 1103-5, 2012 Mar 15.
Article in English | MEDLINE | ID: mdl-22446239

ABSTRACT

An ultrawide-bandwidth, superluminescent light-emitting diode (SLED) utilizing multiple layers of dots of tuned height is reported. Due to thermal effect, the superluminescent phenomenon is observed only under pulse-mode operation. The device exhibits a 3 dB bandwidth of 190 nm with central wavelength of 1020 nm under continuous-wave (cw) conditions. The maximum corresponding output power achieved in this device under cw and pulsed operation conditions are 0.54 mW and 17 mW, respectively.


Subject(s)
Arsenicals/chemistry , Indium/chemistry , Light , Luminescent Measurements/instrumentation , Quantum Dots
3.
Opt Express ; 17(16): 13609-14, 2009 Aug 03.
Article in English | MEDLINE | ID: mdl-19654768

ABSTRACT

We have developed an InAs/InP quantum dot (QD) gain material using a double cap growth procedure and GaP sublayer to tune QDs into the L-band. By using it, a passive L-band mode-locked laser with pulse duration of 445 fs at the repetition rate of 46 GHz was demonstrated. The 3-dB linewidth of the RF spectrum is less than 100 KHz. The lasing threshold injection current is 24 mA with an external differential quantum efficiency of 22% and an average output power of 27 mW. The relationship between pulse duration and 3-dB spectral bandwidth as a function of injection current was investigated.


Subject(s)
Arsenicals/chemistry , Indium/chemistry , Lasers , Phosphines/chemistry , Quantum Dots , Computer Simulation , Computer-Aided Design , Equipment Design , Equipment Failure Analysis , Light , Microwaves , Models, Theoretical , Scattering, Radiation , Semiconductors
4.
Opt Lett ; 33(15): 1702-4, 2008 Aug 01.
Article in English | MEDLINE | ID: mdl-18670509

ABSTRACT

We report on the generation of dual-wavelength self-mode-locking pulses from an InP-based quantum dot laser. The demonstrated device operates simultaneously at both 1543.7 and 1571.7 nm and has a repetition rate of 92.5 GHz. The pulse width is below 960 fs, and the average power coupled to a cleaved single-mode fiber is nearly 9 mW at a current bias of 60 mA.

5.
Opt Express ; 16(14): 10835-40, 2008 Jul 07.
Article in English | MEDLINE | ID: mdl-18607499

ABSTRACT

For the first time, we report femtosecond pulses from a passive single-section InAs/InP quantum-dot (QD) mode-locked laser (MLL) with the active length of 456 microm and ridge width of 2.5 microm at the C-band wavelength range. Without any external pulse compression, the transform-limited Gaussian-pulses are generated at the 92 GHz repetition rate with the 312 fs pulse duration, which is the shortest pulse from any directly electric-pumping semiconductor MLLs to our best knowledge. The lasing threshold injection current and external differential quantum efficiency are 17.2 mA and 38%, respectively. We have also investigated the working principles of the proposed QD MLLs.

6.
J Synchrotron Radiat ; 8(Pt 2): 824-6, 2001 Mar 01.
Article in English | MEDLINE | ID: mdl-11512945

ABSTRACT

Fluorescence-mode XAFS has been used to study the local environment about chosen atomic species such as Ga and As in bulk oxide Al(1-x)Ga(x)As (x=0.96) and at the interface between thin (300 A) oxidized Al(1-x)Ga(x)As (x=0.94) film and GaAs substrate in total external-reflection mode. X-ray reflectivity experiments have also been employed to investigate the density profile of the oxide film on a GaAs substrate revealing the density profile as a function of depth. It is important to find out how the As is incorporated at the interface, the interfacial strain, and related local structural parameters for understanding that may be central in developing high performance III-V MOSFET devices.

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