ABSTRACT
OBJECTIVES: The purpose of this study was to formulate explicitly the equation to relate the biaxial strength of multilayered dental ceramics to the fracture load for multilayered discs subjected to biaxial flexure tests. METHODS: Analytical modeling showed that the solutions for multilayered discs subjected to biaxial flexure tests could be obtained from the existing solutions for monolayered systems by replacing the neutral surface position and the flexural rigidity of monolayers with those of multilayers. Finite element analyses were performed on porcelain/zirconia bilayered discs subjected to piston-on-ring and ring-on-ring tests to verify the analytical results. RESULTS: Good agreement was obtained between (i) present analytical results and Roark's formulas for stresses at the top and the bottom surfaces of bimetallic discs subjected to bending, and (ii) present analytical and finite element results for porcelain/zirconia bilayered discs subjected to piston-on-ring and ring-on-ring tests. SIGNIFICANCE: The present closed-form solutions provide a basis for evaluating the biaxial strength of multilayered dental ceramics. Depending upon the strength of the individual layers and the stress distribution through the thickness of the multilayer during tests, cracking can initiate from any layer under tension.
Subject(s)
Dental Porcelain , Crowns , Dental Stress Analysis/methods , Dental Veneers , Elasticity , Finite Element Analysis , Materials Testing , Metal Ceramic Alloys , Pliability , Tensile Strength , ZirconiumABSTRACT
Silicon nitride (Si3N4) ceramics are used in numerous applications because of their superior mechanical properties. Their intrinsically brittle nature is a critical issue, but can be overcome by introducing whisker-like microstructural features. However, the formation of such anisotropic grains is very sensitive to the type of cations used as the sintering additives. Understanding the origin of dopant effects, central to the design of high-performance Si3N4 ceramics, has been sought for many years. Here we show direct images of dopant atoms (La) within the nanometre-scale intergranular amorphous films typically found at grain boundaries, using aberration corrected Z-contrast scanning transmission electron microscopy. It is clearly shown that the La atoms preferentially segregate to the amorphous/crystal interfaces. First-principles calculations confirm the strong preference of La for the crystalline surfaces, which is essential for forming elongated grains and a toughened microstructure. Whereas principles of micrometre-scale structural design are currently used to improve the mechanical properties of ceramics, this work represents a step towards the atomic-level structural engineering required for the next generation of ceramics.
ABSTRACT
This article reports results of experimental studies on the microstructural evolution of nanocrystalline yttrium-stabilized zirconia thin films synthesized on a Si substrate via a polymeric precursor spin-coating approach. Grain growth behavior has been investigated at different annealing temperatures (700-1200 degrees C) for periods of up to 240 h. A similar film thickness (approximately 120 nm) was maintained for all of the samples used in this study, to avoid variation in film thickness-dependent grain growth. The effects of the thermal history of the film and the annealing atmosphere on the grain growth were also studied. A simple semiempirical grain growth model has been developed to describe isothermal annealing data and to predict dynamic grain growth behavior during the sintering of polymeric precursor layers to form cubic-phase nanocrystalline yttrium-stabilized zirconia films.