ABSTRACT
We show how a scanning probe microscope (SPM) can be used to image electron flow through InAs nanowires, elucidating the physics of nanowire devices on a local scale. A charged SPM tip is used as a movable gate. Images of nanowire conductance versus tip position spatially map the conductance of InAs nanowires at liquid-He temperatures. Plots of conductance versus backgate voltage without the tip present show complex patterns of Coulomb-blockade peaks. Images of nanowire conductance identify their source as multiple quantum dots formed by disorder along the nanowire--each dot is surrounded by a series of concentric rings corresponding to Coulomb blockade peaks. An SPM image locates the dots and provides information about their size. In this way, SPM images can be used to understand the features that control transport through nanowires. The nanowires were grown from metal catalyst particles and have diameters approximately 80 nm and lengths 2-3 microm.
Subject(s)
Arsenicals/chemistry , Indium/chemistry , Microscopy, Scanning Probe/methods , Nanotechnology/methods , Nanotubes/chemistry , Nanotubes/ultrastructure , Quantum Dots , Electron Transport , Materials Testing , Particle SizeABSTRACT
Images of a single-electron quantum dot were obtained in the Coulomb blockade regime at liquid He temperatures using a cooled scanning probe microscope (SPM). The charged SPM tip shifts the lowest energy level in the dot and creates a ring in the image corresponding to a peak in the Coulomb-blockade conductance. Fits to the line shape of the ring determine the tip-induced shift of the energy of the electron state in the dot. SPM manipulation of electrons in quantum dots promises to be useful in understanding, building, and manipulating circuits for quantum information processing.
