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1.
Article in English | MEDLINE | ID: mdl-16463493

ABSTRACT

This paper describes fabrication and characterization results of piezoelectric micromachined ultrasonic transducers (pMUTs) based on 2-microm-thick Pb(Zr0.53Ti0.47O3) (PZT) thin films. The applied structures are circular plates held at four bridges, thus partially unclamped. A simple analytical model for the fully clamped structure is used as a reference to optimize design parameters such as thickness relations and electrodes, and to provide approximate predictions for coupling coefficients related to previously determined thin film properties. The best coupling coefficient was achieved with a 270-microm plate and amounted to kappa2 = 5.3%. This value compares well with the calculated value based on measured small signal dielectric (epsilon = 1050) and piezoelectric (e3l,f = 15 Cm(-2)) properties of the PZT thin film at 100 kV/cm dc bias. The resonances show relatively large Q-factors, which can be partially explained by the small diameters as compared to the sound wavelength in air and in the test liquid (Fluorinert 77). A transmit-receive experiment with two quasi-identical pMUTs was performed showing significant signal transmission up to a distance of 20 cm in air and 2 cm in the test liquid.


Subject(s)
Computer-Aided Design , Lead/chemistry , Linear Models , Membranes, Artificial , Microelectrodes , Titanium/chemistry , Transducers , Ultrasonography/instrumentation , Zirconium/chemistry , Computer Simulation , Electric Capacitance , Electrochemistry/instrumentation , Electrochemistry/methods , Electronics, Medical , Equipment Design , Equipment Failure Analysis , Lead/radiation effects , Miniaturization , Titanium/radiation effects , Ultrasonography/methods , Zirconium/radiation effects
2.
Appl Opt ; 41(1): 239-44, 2002 Jan 01.
Article in English | MEDLINE | ID: mdl-11900440

ABSTRACT

An x-ray multilayer monochromator with improved resolution and a low specular background is presented. The monochromator consists of a lamellar multilayer amplitude grating with appropriate parameters used at the zeroth diffraction order. The device is fabricated by means of combining deposition of thin films on a nanometer scale, UV lithography, and reactive ion etching. The performance of this new monochromator at photon energies near 1500 eV is shown.

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