ABSTRACT
This paper review presents Single Event Effects (SEE) irradiation tests under heavy ions of the test-chip of D-Flip-Flop (DFF) cells and complete readout integrated circuits (ROIC) as a function of temperature, down to 50 K. The analyses of the experimental data are completed using the SEE prediction tool MUSCA SEP3. The conclusions derived from the experimental measurements and related analyses allow to update the current SEE radiation hardness assurance (RHA) for readout integrated circuits of infrared image sensors used at cryogenic temperatures. The current RHA update is performed on SEE irradiation tests at room temperature, as opposed to the operational cryogenic temperature. These tests include SET (Single Event Transient), SEU (Single Event Upset) and SEFI (Single Event Functional Interrupt) irradiation tests. This update allows for reducing the cost of ROIC qualifications and the test setup complexity for each space mission.
ABSTRACT
The radiation responses of different high-power erbium/ytterbium-codoped fiber amplifiers (HP-EYDFA) have been investigated up to 100 krad (SiO2) dose levels. These devices are able to deliver 20 W of signal output power at 1565 nm by pumping at 915 nm (43 W) radiation tolerant (Er/Yb) or radiation hardened (ErYbCe) active few mode fibers; these performances are needed for free-space communications between low-orbit satellites and ground transceivers. X-ray irradiation results show that, thanks to a positive influence of the photo- and thermal-bleaching phenomena associated with such high-power operating conditions, the gain degradation levels of HP-EYDFA based on radiation hardened fibers remain below 6% after 100 krad at an accelerated dose rate of 3.4 rad/s.
