Dust Monitors in JET with ITER-like Wall for Diagnosis of Mobilized Particles and Co-Deposited Layers.

Silicon plates were installed above the inner and outer divertor of the JET with the ITER-like wall (ILW) after the second and third ILW campaigns to monitor dust generation and deposition with the aim to determine the morphology and content of individual particles and co-deposits, including deuterium content. Particular interest was in metal-based particles: Be, W, steel, Cu. Ex-situ examination after two ILW campaigns was performed by a set of microscopy and ion beam methods including micro-beam nuclear reaction analysis and particle-induced X-ray emission. Different categories of Be-rich particles were found: co-deposits peeled-off from plasma-facing components (PFC), complex multi-element spherical objects, and solid metal splashes and regular spherical droplets. The fuel content on the two latter categories was at the level of 1 × 1016 at/cm-2 indicating that Be melting and splashing occurred in the very last phase of the second experimental campaign. The splashes adhere firmly to the substrate thus not posing risk of Be dust mobilisation. No tungsten droplets were detected. The only W-containing particles were fragments of tungsten coatings from the divertor tiles.

Monitoring Ion Track Formation Using In Situ RBS/c, ToF-ERDA, and HR-PIXE.

The aim of this work is to investigate the feasibility of ion beam analysis techniques for monitoring swift heavy ion track formation. First, the use of the in situ Rutherford backscattering spectrometry in channeling mode to observe damage build-up in quartz SiO₂ after MeV heavy ion irradiation is demonstrated. Second, new results of the in situ grazing incidence time-of-flight elastic recoil detection analysis used for monitoring the surface elemental composition during ion tracks formation in various materials are presented. Ion tracks were found on SrTiO₃, quartz SiO₂, a-SiO₂, and muscovite mica surfaces by atomic force microscopy, but in contrast to our previous studies on GaN and TiO₂, surface stoichiometry remained unchanged. Third, the usability of high resolution particle induced X-ray spectroscopy for observation of electronic dynamics during early stages of ion track formation is shown.