Ultrafast hole spin qubit with gate-tunable spin-orbit switch functionality.

Quantum computers promise to execute complex tasks exponentially faster than any possible classical computer, and thus spur breakthroughs in quantum chemistry, material science and machine learning. However, quantum computers require fast and selective control of large numbers of individual qubits while maintaining coherence. Qubits based on hole spins in one-dimensional germanium/silicon nanostructures are predicted to experience an exceptionally strong yet electrically tunable spin-orbit interaction, which allows us to optimize qubit performance by switching between distinct modes of ultrafast manipulation, long coherence and individual addressability. Here we used millivolt gate voltage changes to tune the Rabi frequency of a hole spin qubit in a germanium/silicon nanowire from 31 to 219 MHz, its driven coherence time between 7 and 59 ns, and its Landé g-factor from 0.83 to 1.27. We thus demonstrated spin-orbit switch functionality, with on/off ratios of roughly seven, which could be further increased through improved gate design. Finally, we used this control to optimize our qubit further and approach the strong driving regime, with spin-flipping times as short as ~1 ns.

Vectorial scanning force microscopy using a nanowire sensor.

Self-assembled nanowire (NW) crystals can be grown into nearly defect-free nanomechanical resonators with exceptional properties, including small motional mass, high resonant frequency and low dissipation. Furthermore, by virtue of slight asymmetries in geometry, a NW's flexural modes are split into doublets oscillating along orthogonal axes. These characteristics make bottom-up grown NWs extremely sensitive vectorial force sensors. Here, taking advantage of its adaptability as a scanning probe, we use a single NW to image a sample surface. By monitoring the frequency shift and direction of oscillation of both modes as we scan above the surface, we construct a map of all spatial tip-sample force derivatives in the plane. Finally, we use the NW to image electric force fields distinguishing between forces arising from the NW charge and polarizability. This universally applicable technique enables a form of atomic force microscopy particularly suited to mapping the size and direction of weak tip-sample forces.