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1.
Opt Express ; 22(14): 16897-902, 2014 Jul 14.
Article in English | MEDLINE | ID: mdl-25090506

ABSTRACT

A new wavelength - dispersive X-ray spectrometer for scanning electron microscopy (SEM) has been developed. This spectrometer can cover an energy range from 50 eV to 1120 eV by using an array made of seventeen reflection zone plates. Soft X-ray emission spectra of simple elements of Li, Be, B, C, N, Ti, V, O, Cr, Mn, Fe, Co, Ni, Cu, Zn and Ga were measured. The overall energy resolving power on the order of E/ΔE ~80 to 160 has been demonstrated. Spectrometer with 200 reflection zone plates has been used as a multi-channel analyser in the energy range of 100 - 1000 eV for quasi - continuous spectra measurements. The predicted energy-resolving power on the order of E/ΔE = 50 has been achieved in the entire energy range.

2.
Opt Express ; 13(21): 8671-7, 2005 Oct 17.
Article in English | MEDLINE | ID: mdl-19498898

ABSTRACT

We demonstrate femtosecond operation of a Nd-doped mi-crostructure fiber laser. The fiber provides gain and anomalous dispersion at the lasing wavelength of 1.06 microm and enables the construction of short and simple cavity designs. The laser is passively mode-locked by the combined action of a saturable absorber mirror, fiber nonlinearity, and dispersion and produces transform limited sub-400-fs pulses with a pulse energy as high as 100 pJ.

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