ABSTRACT
The Multiangle Imaging Spectroradiometer makes use of an onboard calibration system that includes two Spectralon panels that are used to reflect sunlight into the cameras. During preflight testing, these panels were quantified in terms of their bidirectional reflectance distribution function, which was measured as a function of the source-incident and detector view angles and at laser wavelengths of 442.0, 632.8, and 859.9 nm. Principal plane measurements are presented in which polarizations of the source and detector are analyzed. These data are unique and valuable in modeling Spectralon reflectance properties and for experiments in which polarization sensitivities are important.
ABSTRACT
The directional-hemispherical reflectance is obtained for Spectralon, the material chosen for onboard radiometric calibration of the multiangle imaging spectroradiometer, at laser wavelengths of 442, 632.8, and 859.9 nm. With p- and s-polarized incident light and for an angle of incidence of 45 degrees , the bidirectional reflectance distribution function was measured over a polar angle range of 1-85 degrees and a range of azimuthal angles of 0-180 degrees in 10 degrees increments. The resultant directional-hemispherical reflectance is found by integration to be 1.00 ? 0.01 at 442 nm, 0.953 ? 0.01 at 632.8 nm, and 0.956 ? 0.01 at 859.9 nm. The experimental methodology and the data analysis are presented together with a full discussion of the primary experimental errors.
