Optimisation of Negative Fixed Charge Based Edge Termination for Vertical GaN Schottky Devices.

This study focuses on the impact of negative fixed charge, achieved through fluorine (F) implantation, on breakdown voltage (BV) enhancement in vertical GaN Schottky diodes. Several device and implant-related parameters are examined using Synopsys Sentaurus TCAD simulations in order to determine the optimum fixed negative charge concentration required to achieve the highest BV. The simulated structure consisted of a Schottky diode with a box consisting of negative fixed charges to achieve the edge termination of the Schottky device. An empirical equation is proposed to determine the optimum fixed charge concentration for the highest BV based on depth. The simulation also considered implantation profiles derived from SIMS data from an actual device implanted with multi-energy and multi-dose F. It is demonstrated that the BV has a similar dependence on the key parameters like in the box profile. In summary, this work provides valuable insights into optimizing edge termination techniques using negative fixed charge for improved BV in vertical GaN power devices.

Coherent tunneling in an AlGaN/AlN/GaN heterojunction captured through an analogy with a MOS contact.

Due to their wide band gaps, III-N materials can exhibit behaviors ranging from the semiconductor class to the dielectric class. Through an analogy between a Metal/AlGaN/AlN/GaN diode and a MOS contact, we make use of this dual nature and show a direct path to capture the energy band diagram of the nitride system. We then apply transparency calculations to describe the forward conduction regime of a III-N heterojunction diode and demonstrate it realizes a tunnel diode, in contrast to its regular Schottky Barrier Diode designation. Thermionic emission is ruled out and instead, a coherent electron tunneling scenario allows to account for transport at room temperature and higher.

Voltage and power-controlled regimes in the progressive unipolar RESET transition of HfO2-based RRAM.

Resistive switching (RS) based on the formation and rupture of conductive filament (CF) is promising in novel memory and logic device applications. Understanding the physics of RS and the nature of CF is of utmost importance to control the performance, variability and reliability of resistive switching memory (RRAM). Here, the RESET switching of HfO2-based RRAM was statistically investigated in terms of the CF conductance evolution. The RESET usually combines an abrupt conductance drop with a progressive phase ending with the complete CF rupture. RESET1 and RESET2 events, corresponding to the initial and final phase of RESET, are found to be controlled by the voltage and power in the CF, respectively. A Monte Carlo simulator based on the thermal dissolution model of unipolar RESET reproduces all of the experimental observations. The results contribute to an improved physics-based understanding on the switching mechanisms and provide additional support to the thermal dissolution model.

Ferrocene and porphyrin monolayers on Si(100) surfaces: preparation and effect of linker length on electron transfer.

The missing link: Ferrocene and porphyrin monolayers are tethered on silicon surfaces with short (see picture, left) or long (right) linkers. Electron transfer to the silicon substrate is faster for monolayers with a short linker.Ferrocene and porphyrin derivatives are anchored on Si(100) surfaces through either a short two-carbon or a long 11-carbon linker. The two tether lengths are obtained by using two different grafting procedures: a single-step hydrosilylation is used for the short linker, whereas for the long linker a multistep process involving a 1,3-dipolar cycloaddition is conducted, which affords ferrocene-triazole-(CH(2))(11)-Si or Zn(porphyrin)-triazole-(CH(2))(11)-Si links to the surface. The modified surfaces are characterized by X-ray photoelectron spectroscopy and Fourier transform infrared spectroscopy. Cyclic voltammetry experiments show that the redox activity of the tethered ferrocene or porphyrin is maintained for both linker types. Microelectrode capacitor devices incorporating these modified Si(100) surfaces are designed, and their capacitance-voltage (C-V) and conductance-voltage (G-V) profiles are investigated. Capacitance and conductance peaks are observed, which indicates efficient charge transfer between the redox-active monolayers and the electrode surface. Slower electron transfer between the ferrocene or porphyrin monolayer and the electrode surface is observed for the longer linker, which suggests that by adjusting the linker length, the electrical properties of the device, such as charging and discharging kinetics and retention time, could be tuned.