ABSTRACT
We demonstrate low loss photonic crystal waveguides in chalcogenide (Ge(33)As(12)Se(55)) glasses. The measured losses are as low as 21 dB/cm. We experimentally determine the refractive index of the thin film chalcogenide glass to be n = 2.6 and demonstrate that dispersion engineering can be performed up to a group index of ng = 40 in this relatively low refractive index contrast system.
Subject(s)
Chalcogens/chemistry , Crystallization/methods , Refractometry/instrumentation , Equipment Design , Equipment Failure Analysis , Light , Materials Testing , Photons , Scattering, RadiationABSTRACT
We demonstrate a high-Q(approximately 125,000) photonic crystal (PhC) cavity formed using a postprocessing optical exposure technique where the refractive index of a photosensitive chalcogenide PhC is modified locally. The evolution of the cavity resonances was monitored in situ during writing using a tapered fiber evanescent coupling system, and the Q of 125,000 represents 1 order of magnitude increase over previously reported cavities in two-dimensional chalcogenide glass PhC.
ABSTRACT
We demonstrate that a highly bend-resistant fiber can be realized. It is shown theoretically that, by introducing both depressed and elevated rings into the cladding, bending loss can be reduced significantly. A fiber based on this design has been fabricated and characterized as a first step toward achieving this goal. The results show that a multiple-cladding fiber is highly bend resistant when compared with the standard telecom single-mode fiber.
Subject(s)
Algorithms , Fiber Optic Technology/instrumentation , Image Enhancement/instrumentation , Image Interpretation, Computer-Assisted/methods , Light , Computer Simulation , Computer-Aided Design , Energy Transfer , Equipment Design , Equipment Failure Analysis , Fiber Optic Technology/methods , Image Enhancement/methods , Image Interpretation, Computer-Assisted/instrumentation , Models, Theoretical , Reproducibility of Results , Scattering, Radiation , Sensitivity and SpecificityABSTRACT
Planar silicon dioxide optical waveguides were deposited by use of a plasma-activated reactive evaporation system, at a low deposition temperature and with reduced hydrogen contamination, on thermally oxidized silicon wafers. The deposited films show a refractive-index inhomogeneity of less than 0.1%, a thickness nonuniformity of less than 5%, and a material birefringence of approximately 5 x 10(-4). Rib-type channel waveguides were formed on the deposited films by means of hydrofluoric acid etching. The transmission loss of the rib waveguides is determined to be as low as 0.3 dB/cm at a wavelength of 1310 nm for TE polarization, after subtraction of the calculated leakage and scattering losses. Owing to the presence of the OH vibrational overtone band, an additional loss peak of 1 dB/cm is found near the 1385-nm wavelength. The experimental results of transmission loss at wavelengths of 1310 and 1550 nm are compared with analytic expressions for interface scattering and leakage loss.
