ABSTRACT
An approach to quantifying adsorbed protein layers at the protein/metal interface through spectroscopic ellipsometry using an in situ technique is described. A combinatorial binary Cu(1-x)Al(x) (0Subject(s)
Aluminum/chemistry
, Copper/chemistry
, Interferometry/methods
, Proteins/chemistry
, Spectrum Analysis/methods
, Adsorption
, Albumins/chemistry
, Fibrinogen/chemistry
, Interferometry/instrumentation
, Proteins/pharmacokinetics
, Reproducibility of Results
, Spectrum Analysis/instrumentation
, Surface Properties
