Total retardance measurements based on the complex Fourier coefficients for the rotating polarizer analyzer system.

We propose a demodulation algorithm based on the calculus of the complex Fourier coefficients; we used a dual rotating polarizer-analyzer polarimeter to show the feasibility of our proposal. Our demodulation algorithm considers the frequency response obtained by the system, and its possible to calculate the total retardation, fast axis orientation and ellipticity of a sample. Our proposal does not require recovering the full Mueller matrix from getting those parameters. In addition, as the proposal does not use retarders for the measurement, the system presents potential applications for multi-wavelength measurements on phase retardation samples. We show experimental results showing the capabilities of our proposal in characterizing a polarization retardance sample.

Mueller-matrix modeling and characterization of a dual-crystal electro-optic modulator.

A general mathematical model based on Mueller-matrix calculation is presented to describe the optical behavior of a dual-crystal electro-optic modulator. The two crystals inside the modulator are oriented at ± 45° with respect to the horizontal, thereby cancelling natural birefringence and temperature-induced birefringence. We describe the behavior of the modulator as a function of the ellipticity of the crystals, the rotation angles of the crystals and the applied voltage. By fitting the measured data with a Mueller-matrix model that uses values for the ellipticity and orientation angles of the crystals, the simulated data and the experimental measurements could be matched. This Mueller-matrix includes physical properties of the thermally compensated electro optic modulator, and the matrix can be used in simulations where these device-specific properties are important, for instance in the modeling of a polarization-sensitive optical coherence tomography system.

Refractive index and geometrical thickness measurement of thin optical samples by a transmitted Gaussian beam.

We describe a technique for simultaneously measuring the local geometrical thickness and the refractive index of semi-transparent thin plates by means of the diffractive properties of a transmitted Gaussian beam. The technique is based on measuring the semi-width of the transmitted beam and the shift of the Gaussian centroid caused by introducing a tilt on the sample under test. A homodyne technique is devised to accurately characterize the Gaussian beam. Our proposal does not require any prior information of the sample under study. We present analytical support of our technique and we give experimental results.

Refractive index and geometrical thickness measurement of a transparent pellicle in air by Gaussian beam defocusing.

We demonstrate that it is possible to measure the local geometrical thickness and the refractive index of a transparent pellicle in air by combining the diffractive properties of a Gaussian beam with the analytical equations of the light that propagates through a thin layer. We show that our measurement technique is immune to inherent piston-like vibrations present in the pellicle. As our measurements are based on characterizing properly the Gaussian beam in a plane of detection, a homodyne technique for this purpose is devised and described. The feasibility of our proposal is confirmed by measuring local geometrical thicknesses and the refractive index of a commercially available stretch film.