Controllable electronic properties, contact barriers and contact types in a TaSe2/WSe2 metal-semiconductor heterostructure.

Two-dimensional (2D) metallic TaSe2 and semiconducting WSe2 materials have been successfully fabricated in experiments and are considered as promising contact and channel materials, respectively, for the design of next-generation electronic devices. Herein, we design a metal-semiconductor (M-S) heterostructure combining metallic TaSe2 and semiconducting WSe2 materials and investigate the atomic structure, electronic properties and controllable contact types of the combined TaSe2/WSe2 M-S heterostructure using first-principles calculations. Our results reveal that the TaSe2/WSe2 M-S heterostructure can adopt four different stable stacking configurations, all of which exhibit enhanced elastic constants compared to the constituent monolayers. Furthermore, the TaSe2/WSe2 M-S heterostructure exhibits p-type Schottky contact (SC) with Schottky barriers ranging from 0.36 to 0.49 eV, depending on the stacking configurations. The TaSe2/WSe2 M-S heterostructure can be considered as a promising M-S contact for next-generation electronic Schottky devices owing to its small tunneling resistivity of about 2.14 × 10-9 Ω cm2. More interestingly, the TaSe2/WSe2 M-S heterostructure exhibits tunable contact types and contact barriers under the application of an electric field. A negative electric field induces a transition from Schottky contact type to ohmic contact (OC) type. On the other hand, a positive electric field leads to a transformation from p-type SC to n-type SC. Our findings provide valuable insights into the practical applications of the TaSe2/WSe2 M-S heterostructure towards next-generation electronic devices.

First-principles examination of two-dimensional Janus quintuple-layer atomic structures XCrSiN2 (X = S, Se, and Te).

In this work, we propose novel two-dimensional Janus XCrSiN2 (X = S, Se, and Te) single-layers and comprehensively investigate their crystal structure, electronic properties, and carrier mobility by using a first-principles method. These configurations are the combination of the CrSi2N4 material and a transition metal dichalcogenide. The X-Cr-SiN2 single-layers are constructed by replacing the N-Si-N atomic layer on one side with chalcogen atoms (S, Se, or Te). The structural characteristics, mechanical or thermal stabilities, and electronic properties are investigated adequately. All three examined configurations are energetically stable and are all small-bandgap semiconductors (<1 eV). Since the mirror symmetry is broken in the Janus material, there exists a remarkable built-in electric field and intrinsic dipole moment. Therefore, the spin-orbit interaction is considered intensively. However, it is observed that the spin-orbit coupling has insignificant effects on the electronic properties of XCrSiN2 (X = S, Se, and Te). Moreover, an external electric field and strain are applied to evaluate the adjustment of the electronic features of the three structures. The transport properties of the proposed configurations are calculated and analyzed systematically, indicating the highly directional isotropy. Our results suggest that the proposed Janus XCrSiN2 could be potential candidates for various applications, especially in nanoscale electronic devices.