Customization of an atomic force microscope for multidimensional measurements under environmental conditions.

Atomic force microscopy (AFM) is an analytical surface characterization tool that reveals the surface topography at a nanometer length scale while probing local chemical, mechanical, and even electronic sample properties. Both contact (performed with a constant deflection of the cantilever probe) and dynamic operation modes (enabled by demodulation of the oscillation signal under tip-sample interaction) can be employed to conduct AFM-based measurements. Although surface topography is accessible regardless of the operation mode, the resolution and the availability of the quantified surface properties depend on the mode of operation. However, advanced imaging techniques, such as frequency modulation, to achieve high resolution, quantitative surface properties are not implemented in many commercial systems. Here, we show the step-by-step customization of an atomic force microscope. The original system was capable of surface topography and basic force spectroscopy measurements while employing environmental control, such as temperature variation of the sample/tip, etc. We upgraded this original setup with additional hardware (e.g., a lock-in amplifier with phase-locked loop capacity, a high-voltage amplifier, and a new controller) and software integration while utilizing its environmental control features. We show the capabilities of the customized system with frequency modulation-based topography experiments and automated voltage and/or distance spectroscopy, time-resolved AFM, and two-dimensional force spectroscopy measurements under ambient conditions. We also illustrate the enhanced stability of the setup with active topography and frequency drift corrections. We believe that our methodology can be useful for the customization and automation of other scanning probe systems.

Intercalation leads to inverse layer dependence of friction on chemically doped MoS2.

We present results of atomic-force-microscopy-based friction measurements on Re-doped molybdenum disulfide (MoS2). In stark contrast to the widespread observation of decreasing friction with increasing number of layers on two-dimensional (2D) materials, friction on Re-doped MoS2exhibits an anomalous, i.e. inverse, dependence on the number of layers. Raman spectroscopy measurements combined withab initiocalculations reveal signatures of Re intercalation. Calculations suggest an increase in out-of-plane stiffness that inversely correlates with the number of layers as the physical mechanism behind this remarkable observation, revealing a distinctive regime of puckering for 2D materials.

The Effect of Photoinduced Surface Oxygen Vacancies on the Charge Carrier Dynamics in TiO2 Films.

Metal-oxide semiconductors (MOS) are widely utilized for catalytic and photocatalytic applications in which the dynamics of charged carriers (e.g., electrons, holes) play important roles. Under operation conditions, photoinduced surface oxygen vacancies (PI-SOV) can greatly impact the dynamics of charge carriers. However, current knowledge regarding the effect of PI-SOV on the dynamics of hole migration in MOS films, such as titanium dioxide, is solely based upon volume-averaged measurements and/or vacuum conditions. This limits the basic understanding of hole-vacancy interactions, as they are not capable of revealing time-resolved variations during operation. Here, we measured the effect of PI-SOV on the dynamics of hole migration using time-resolved atomic force microscopy. Our findings demonstrate that the time constant associated with hole migration is strongly affected by PI-SOV, in a reversible manner. These results will nucleate an insightful understanding of the physics of hole dynamics and thus enable emerging technologies, facilitated by engineering hole-vacancy interactions.

Confronting interatomic force measurements.

The quantitative interatomic force measurements open a new pathway to materials characterization, surface science, and chemistry by elucidating the tip-sample interaction forces. Atomic force microscopy is the ideal platform to gauge interatomic forces between the tip and the sample. For such quantitative measurements, either the oscillation frequency or the oscillation amplitude and the phase of a vibrating cantilever are recorded as a function of the tip-sample separation. These experimental quantities are subsequently converted into the tip-sample interaction force, which can be compared with interatomic force laws to reveal the governing physical phenomena. Recently, it has been shown that the most commonly applied mathematical conversion techniques may suffer a significant deviation from the actual tip-sample interaction forces. To avoid the assessment of unphysical interatomic forces, the use of either very small (i.e., a few picometers) or very large oscillation amplitudes (i.e., a few nanometers) has been proposed. However, the use of marginal oscillation amplitudes gives rise to another problem as it lacks the feasibility due to the adverse signal-to-noise ratios. Here, we show a new mathematical conversion principle that confronts interatomic force measurements while preserving the oscillation amplitude within the experimentally achievable and favorable limits, i.e., tens of picometers. Our theoretical calculations and complementary experimental results demonstrate that the proposed technique has three major advantages over existing methodologies: (I) eliminating mathematical instabilities of the reconstruction of tip-sample interaction force, (II) enabling accurate conversion deep into the repulsive regime of tip-sample interaction force, and (III) being robust to the uncertainty of the oscillation amplitude and the measurement noise. Due to these advantages, we anticipate that our methodology will be the nucleus of a reliable evaluation of material properties with a more accurate measurement of tip-sample interaction forces.

Ergodic and Nonergodic Dynamics of Oxygen Vacancy Migration at the Nanoscale in Inorganic Perovskites.

Perovskites are widely utilized either as a primary component or as a substrate in which the dynamics of charged oxygen vacancy defects play an important role. Current knowledge regarding the dynamics of vacancy mobility in perovskites is solely based upon volume- and/or time-averaged measurements. This impedes our understanding of the basic physical principles governing defect migration in inorganic materials. Here, we measure the ergodic and nonergodic dynamics of vacancy migration at the relevant spatial and temporal scales using time-resolved atomic force microscopy techniques. Our findings demonstrate that the time constant associated with oxygen vacancy migration is a local property and can change drastically on short length and time scales, such that nonergodic states lead to a dramatic increase in the migration barrier. This correlated spatial and temporal variation in oxygen vacancy dynamics can extend hundreds of nanometers across the surface in inorganic perovskites.

Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy.

With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample interaction potentials. Such quantitative experiments using noncontact frequency modulation atomic force microscopy is based on the accurate measurement of the resonance frequency shift due to the tip-sample interaction. Here, we experimentally show that the resonance frequency of oscillating probes used for SPM experiments change systematically as a function of oscillation amplitude under typical operating conditions. This change in resonance frequency is not due to tip-sample interactions, but rather due to the cantilever strain or geometric effects and thus the resonance frequency is a function of the oscillation amplitude. Our numerical calculations demonstrate that the amplitude dependence of the resonance frequency is an additional yet overlooked systematic error source that can result in nonnegligible errors in measured interaction potentials and forces. Our experimental results and complementary numerical calculations reveal that the frequency shift due to this amplitude dependence needs to be corrected even for experiments with active oscillation amplitude control to be able to quantify the tip-sample interaction potentials and forces with milli-electron volt and pico-Newton resolutions.

Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance.

Atomic force microscopy (AFM) is a versatile surface characterization method that can map a sample's topography with high spatial resolution while simultaneously interrogating its surface chemistry through the site-specific high-resolution quantification of the forces acting between the sample and the probe tip. Thanks to considerable advances in AFM measurement technology, such local measurements of chemical properties have gained much popularity in recent years. To this end, dynamic AFM methodologies are implemented where either the oscillation frequency or the oscillation amplitude and phase of the vibrating cantilever are recorded as a function of tip-sample distance and subsequently converted to reflect tip-sample forces or interaction potentials. Such conversion has, however, been shown to produce non-negligible errors when applying the most commonly used mathematical conversion procedures if oscillation amplitudes are of the order of the decay length of the interaction. Extending on these earlier findings, the computational study presented in this paper reveals that the degree of divergence from actual values may also critically depend on both the overall strength of tip-sample interaction and the distance at which the interaction is obtained. These systematic errors can, however, be effectively eliminated by using oscillation amplitudes that are sufficiently larger than the decay length of the interaction potential.

Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements.

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors.

Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties with high-resolution has gained much popularity in recent years with advances in dynamic AFM methodologies. A calibration factor is required to convert the electrical readout to a mechanical oscillation amplitude in order to extract quantitative information about the surface. We propose a new calibration technique for the oscillation amplitude of electrically driven probes using the principle of energy balance. Our technique relies on the measurement of the energy input to maintain the oscillation amplitude constant. With the measurement of the energy input to the probe, a mechanical oscillation amplitude is calculated and a calibration factor to convert the electrical readout in volts to a mechanical oscillation amplitude in Ångströms is obtained. We demonstrate the application of the new technique with a quartz tuning fork including the qPlus configuration, while the same principle can be applied to other piezoelectric resonators such as length extension resonators or piezoelectric cantilevers. The calibration factor obtained by this technique is found to be in agreement with using the thermal noise spectrum method for capsulated and decapsulated tuning forks and tuning forks in the qPlus configuration.

Exploring load, velocity, and surface disorder dependence of friction with one-dimensional and two-dimensional models.

The effect of surface disorder, load, and velocity on friction between a single asperity contact and a model surface is explored with one-dimensional and two-dimensional Prandtl-Tomlinson (PT) models. We show that there are fundamental physical differences between the predictions of one-dimensional and two-dimensional models. The one-dimensional model estimates a monotonic increase in friction and energy dissipation with load, velocity, and surface disorder. However, a two-dimensional PT model, which is expected to approximate a tip-sample system more realistically, reveals a non-monotonic trend, i.e. friction is inert to surface disorder and roughness in wearless friction regime. The two-dimensional model discloses that the surface disorder starts to dominate the friction and energy dissipation when the tip and the sample interact predominantly deep into the repulsive regime. Our numerical calculations address that tracking the minimum energy path and the slip-stick motion are two competing effects that determine the load, velocity, and surface disorder dependence of friction. In the two-dimensional model, the single asperity can follow the minimum energy path in wearless regime; however, with increasing load and sliding velocity, the slip-stick movement dominates the dynamic motion and results in an increase in friction by impeding tracing the minimum energy path. Contrary to the two-dimensional model, when the one-dimensional PT model is employed, the single asperity cannot escape to the minimum energy minimum due to constraint motion and reveals only a trivial dependence of friction on load, velocity, and surface disorder. Our computational analyses clarify the physical differences between the predictions of the one-dimensional and two-dimensional models and open new avenues for disordered surfaces for low energy dissipation applications in wearless friction regime.

Using ZnO-Cr2O3-ZnO heterostructures to characterize polarization penetration depth through non-polar films.

The ability to affect the surface properties of non-polar Cr2O3 films through polar ZnO(0001) and (0001[combining macron]) supports was investigated by characterizing the polarity of ZnO films grown on top of the Cr2O3 surfaces. The growth and geometric and electronic structures of the ZnO films were characterized with X-ray photoelectron spectroscopy, ultra-violet photoelectron spectroscopy, reflection high-energy electron diffraction, low-energy electron diffraction, and X-ray diffraction. The ZnO growth mode was Stranski-Krastanov, which can be attributed to the ZnO layers initially adopting a non-polar structure with a lower surface tension before transitioning to the polar bulk structure with a higher surface energy. A similar result has been reported for ZnO growth on α-Al2O3(0001), which is isostructural with Cr2O3. The polarity of the added ZnO layer was determined by examining the surface morphology following wet chemical etching with atomic force microscopy and by characterizing the surface reactivity via temperature-programmed desorption of alcohols, which strongly depends on the ZnO polarization direction. Consistent with prior work on ZnO growth on bulk Cr2O3(0001), both measurements indicate that thick Cr2O3 layers support ZnO(0001[combining macron]) growth regardless of the underlying ZnO substrate polarization; however, the polarization direction of ZnO films grown on Cr2O3 films less than three repeat units thick follows the direction of the underlying substrate polarization. These findings show that it is possible to manipulate the surface properties of non-polar materials with a polar substrate, but that the effect does not penetrate past just a couple of repeat units.

Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis.

Quartz tuning forks that have a probe tip attached to the end of one of its prongs while the other prong is arrested to a holder ("qPlus" configuration) have gained considerable popularity in recent years for high-resolution atomic force microscopy imaging. The small size of the tuning forks and the complexity of the sensor architecture, however, often impede predictions on how variations in the execution of the individual assembly steps affect the performance of the completed sensor. Extending an earlier study that provided numerical analysis of qPlus-style setups without tips, this work quantifies the influence of tip attachment on the operational characteristics of the sensor. The results using finite element modeling show in particular that for setups that include a metallic tip that is connected via a separate wire to enable the simultaneous collection of local forces and tunneling currents, the exact realization of this wire connection has a major effect on sensor properties such as spring constant, quality factor, resonance frequency, and its deviation from an ideal vertical oscillation.

Growth of two dimensional silica and aluminosilicate bilayers on Pd(111): from incommensurate to commensurate crystalline.

Two-dimensional (2D) silica (SiO2) and aluminosilicate (AlSi3O8) bilayers grown on Pd(111) were fabricated and systematically studied using ultrahigh vacuum surface analysis in combination with theoretical methods, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, low-energy electron diffraction (LEED), scanning tunneling microscopy (STM), and density functional theory. Based on LEED results, both SiO2 and AlSi3O8 bilayers start ordering above 850 K in 2 × 10-6 Torr oxygen. Both bilayers show hexagonal LEED patterns with a periodicity approximately twice that of the Pd(111) surface. Importantly, the SiO2 bilayer forms an incommensurate crystalline structure whereas the AlSi3O8 bilayer crystallizes in a commensurate structure. The incommensurate crystalline SiO2 structure on Pd(111) resulted in a moiré pattern observed with LEED and STM. Theoretical results show that straining the pure SiO2 bilayer to match Pd(111) would cost 0.492 eV per unit cell; this strain energy is reduced to just 0.126 eV per unit cell by replacing 25% of the Si with Al which softens the material and expands the unstrained lattice. Furthermore, the missing electron created by substituting Al3+ for Si4+ is supplied by Pd creating a chemical bond to the AlSi3O8 bilayer, whereas van der Waals interactions predominate for the SiO2 bilayer. The results reveal how the interplay between strain, doping, and charge transfer determine the structure of metal-supported 2D silicate bilayers and how these variables may potentially be exploited to manipulate 2D materials structures.

Exploring site-specific chemical interactions at surfaces: a case study on highly ordered pyrolytic graphite.

A material's ability to interact with approaching matter is governed by the structural and chemical nature of its surfaces. Tailoring surfaces to meet specific needs requires developing an understanding of the underlying fundamental principles that determine a surface's reactivity. A particularly insightful case occurs when the surface site exhibiting the strongest attraction changes with distance. To study this issue, combined noncontact atomic force microscopy and scanning tunneling microscopy experiments have been carried out, where the evolution of the local chemical interaction with distance leads to a contrast reversal in the force channel. Using highly ordered pyrolytic graphite surfaces and metallic probe tips as a model system, we find that at larger tip-sample distances, carbon atoms exhibit stronger attractions than hollow sites while upon further approach, hollow sites become energetically more favorable. For the tunneling current that is recorded at large tip-sample separations during acquisition of a constant-force image, the contrast is dominated by the changes in tip-sample distance required to hold the force constant ('cross-talk'); at smaller separations the contrast turns into a convolution of this cross-talk and the local density of states. Analysis shows that the basic factors influencing the force channel contrast reversal are locally varying decay lengths and an onset of repulsive forces that occurs for distinct surface sites at different tip-sample distances. These findings highlight the importance of tip-sample distance when comparing the relative strength of site-specific chemical interactions.

Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy.

Atomic force microscopy (AFM) and spectroscopy are based on locally detecting the interactions between a surface and a sharp probe tip. For highest resolution imaging, noncontact modes that avoid tip-sample contact are used; control of the tip's vertical position is accomplished by oscillating the tip and detecting perturbations induced by its interaction with the surface potential. Due to this potential's nonlinear nature, however, achieving reliable control of the tip-sample distance is challenging, so much so that despite its power vacuum-based noncontact AFM has remained a niche technique. Here we introduce a new pathway to distance control that prevents instabilities by externally tuning the oscillator's response characteristics. A major advantage of this operational scheme is that it delivers robust position control in both the attractive and repulsive regimes with only one feedback loop, thereby providing an easy-to-implement route to atomic resolution imaging and quantitative tip-sample interaction force measurement.

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction.

Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be affected by piezo nonlinearities, thermal and electronic drift, tip asymmetries, and elastic deformation of the tip apex, these effects need to be considered during image interpretation.In this paper, we analyze their impact on the acquired data, compare different methods to record atomic-resolution surface force fields, and determine the approaches that suffer the least from the associated artifacts. The related discussion underscores the idea that since force fields recorded by using NC-AFM always reflect the properties of both the sample and the probe tip, efforts to reduce unwanted effects of the tip on recorded data are indispensable for the extraction of detailed information about the atomic-scale properties of the surface.