Atmospheric Pressure Plasma Deposition of Hydrophilic/Phobic Patterns and Thin Film Laminates on Any Surface.

Patterned and layered hydrophilic/phobic coatings were deposited on multiple surfaces using nonfluorinated precursors (AA, acrylic acid; PMA, propargyl methacrylate) with an atmospheric pressure dielectric barrier discharge operating in open air. Water contact angles of the resulting films could be tuned from <5° (superhydrophilic) to >135° (very hydrophobic) by adjusting the AA/PMA feed ratio and/or via postdeposition exposure of films to an Ar/O2 plasma treatment. Coatings could be applied to any surface and were seen to be water stable, due in large part to cross-linking induced from the reactivity of the PMA pendant groups. Hybrid hydrophilic/phobic patterns at submillimeter length scales, and philic/phobic/philic laminates were produced using a shadow mask and sequential deposition, respectively. Chemical heterogeneity of films was assessed using XPS, SIMS, and micro-IR imaging and suggest that localization of COOH and OH groups are primarily responsible for hydrophilicity. Overall, this work demonstrates that atmospheric pressure plasma polymerization is a simple and scalable method for robust and tunable control of wettability of surfaces of all kinds.

Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers.

A major challenge regarding the characterization of multilayer films is to perform high-resolution molecular depth profiling of, in particular, organic materials. This experimental work compares the performance of C60(+) and Ar1700(+) for the depth profiling of model multilayer organic films. In particular, the conditions under which the original interface widths (depth resolution) were preserved were investigated as a function of the sputtering energy. The multilayer samples consisted of three thin δ-layers (~8 nm) of the amino acid tyrosine embedded between four thicker layers (~93 nm) of the amino acid phenylalanine, all evaporated on to a silicon substrate under high vacuum. When C60(+) was used for sputtering, the interface quality degraded with depth through an increase of the apparent width and a decay of the signal intensity. Due to the continuous sputtering yield decline with increasing the C60(+) dose, the second and third δ-layers were shifted with respect to the first one; this deterioration was more pronounced at 10 keV, when the third δ-layer, and a fortiori the silicon substrate, could not be reached even after prolonged sputtering. When large argon clusters, Ar1700(+), were used for sputtering, a stable molecular signal and constant sputtering yield were achieved throughout the erosion process. The depth resolution parameters calculated for all δ-layers were very similar irrespective of the impact energy. The experimental interface widths of approximately 10 nm were barely larger than the theoretical thickness of 8 nm for the evaporated δ-layers.

Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams.

With the recent developments in secondary ion mass spectrometry (SIMS), it is now possible to obtain molecular depth profiles and 3D molecular images of organic thin films, i.e. SIMS depth profiles where the molecular information of the mass spectrum is retained through the sputtering of the sample. Several approaches have been proposed for "damageless" profiling, including the sputtering with SF5(+) and C60(+) clusters, low energy Cs(+) ions and, more recently, large noble gas clusters (Ar500-5000(+)). In this article, we evaluate the merits of these different approaches for the in depth analysis of organic photovoltaic heterojunctions involving poly(3-hexylthiophene) (P3HT) as the electron donor and [6,6]-phenyl C61 butyric acid methyl ester (PCBM) as the acceptor. It is demonstrated that the use of 30 keV C60(3+) and 500 eV Cs(+) (500 eV per atom) leads to strong artifacts for layers in which the fullerene derivative PCBM is involved, related to crosslinking and topography development. In comparison, the profiles obtained using 10 keV Ar1700(+) (∼6 eV per atom) do not indicate any sign of artifacts and reveal fine compositional details in the blends. However, increasing the energy of the Ar cluster beam beyond that value leads to irreversible damage and failure of the molecular depth profiling. The profile qualities, apparent interface widths and sputtering yields are analyzed in detail. On the grounds of these experiments and recent molecular dynamics simulations, the discussion addresses the issues of damage and crater formation induced by the sputtering and the analysis ions in such radiation-sensitive materials, and their effects on the profile quality and the depth resolution. Solutions are proposed to optimize the depth resolution using either large Ar clusters or low energy cesium projectiles for sputtering and/or analysis.

Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing.

Organic depth profiling using secondary ion mass spectrometry (SIMS) provides valuable information about the three-dimensional distribution of organic molecules. However, for a range of materials, commonly used cluster ion beams such as C60(n+) do not yield useful depth profiles. A promising solution to this problem is offered by the use of nitric oxide (NO) gas dosing during sputtering to reduce molecular cross-linking. In this study a C60(2+) ion beam is used to depth profile a polystyrene film. By systematically varying NO pressure and sample temperature, we evaluate their combined effect on organic depth profiling. Profiles are also acquired from a multilayered polystyrene and polyvinylpyrrolidone film and from a polystyrene/polymethylmethacrylate bilayer, in the former case by using an optimized set of conditions for C60(2+) and, for comparison, an Ar2000(+) ion beam. Our results show a dramatic improvement for depth profiling with C60(2+) using NO at pressures above 10(-6) mbar and sample temperatures below -75 °C. For the multilayered polymer film, the depth profile acquired using C60(2+) exhibits high signal stability with the exception of an initial signal loss transient and thus allows for successful chemical identification of each of the six layers. The results demonstrate that NO dosing can significantly improve SIMS depth profiling analysis for certain organic materials that are difficult to analyze with C60(n+) sputtering using conventional approaches/conditions. While the analytical capability is not as good as large gas cluster ion beams, NO dosing comprises a useful low-cost alternative for instruments equipped with C60(n+) sputtering.

Double protein functionalized poly-ε-caprolactone surfaces: in depth ToF-SIMS and XPS characterization.

In biomaterial research, great attention has focussed on the immobilization of biomolecules with the aim to increase cell-adhesive properties of materials. Many different strategies can be applied. In previously published work, our group focussed on the treatment of poly-ε-caprolactone (PCL) films by an Ar-plasma, followed by the grafting of 2-aminoethyl methacrylate (AEMA) under UV-irradiation. The functional groups introduced, enabled the subsequent covalent immobilisation of gelatin. The obtained coating was finally applied for the physisorption of fibronectin. The successful PCL surface functionalization was preliminary confirmed using XPS, wettability studies, AFM and SEM. In the present article, we report on an in-depth characterization of the materials developed using ToF-SIMS and XPS analysis. The homogeneous AEMA grafting and the subsequent protein coating steps could be confirmed by both XPS and ToF-SIMS. Using ToF-SIMS, it was possible to demonstrate the presence of polymethacrylates on the surface. From peak deconvoluted XPS results (C- and N-peak), the presence of proteins could be confirmed. Using ToF-SIMS, different positive ions, correlating to specific amino-acids could be identified. Importantly, the gelatin and the fibronectin coatings could be qualitatively distinguished. Interestingly for biomedical applications, ethylene oxide sterilization did not affect the surface chemical composition. This research clearly demonstrates the complementarities of XPS and ToF-SIMS in biomedical surface modification research.

Dynamics of molecular impacts on soft materials: from fullerenes to organic nanodrops.

The present theoretical study explores the interaction of various energetic molecular projectiles and clusters with a model polymeric surface, with direct implications for surface analysis by mass spectrometry. The projectile sizes (up to 23 kDa) are intermediate between the polyatomic ions (SF(5), C(60)) used in secondary ion mass spectrometry and the large organic microdroplets generated, for example, in desorption electrospray ionization. The target is a model of amorphous polyethylene, already used in a previous study [Delcorte, A.; Garrison, B. J. J. Phys. Chem. C 2007, 111, 15312]. The chosen method relies on classical molecular dynamics (MD) simulations, using a coarse-grained description of polymeric samples for high energy or long time calculations (20-50 ps) and a full atomistic description for low energy or short time calculations (<1 ps). Two regions of sputtering or desorption are observed depending on the projectile energy per nucleon (i.e., effectively the velocity). The transition, occurring around 1 eV/nucleon, is identified by a change of slope in the curve of the sputtering yield per nucleon vs energy per nucleon. Beyond 1 eV/nucleon, the sputtering yield depends only on the total projectile energy and not on the projectile nuclearity. Below 1 eV/nucleon, i.e., around the sputtering threshold for small projectiles, yields are influenced by both the projectile energy and nuclearity. Deposition of intact molecular clusters is also observed at the lowest energies per nucleon. The transition in the sputtering curve is connected to a change of energy deposition mechanisms, from atomistic and mesoscopic processes to hydrodynamic flow. It also corresponds to a change in terms of fragmentation. Below 1 eV/nucleon, the projectiles are not able to induce bond scissions in the sample. This region of molecular emission with minimal fragmentation offers new analytical perspectives, out of reach of smaller molecular clusters such as fullerenes.

Method for macromolecular colocalization using atomic recombination in dynamic SIMS.

Localizing two or more components of assemblies in biological systems requires both continued development of fluorescence techniques and invention of entirely new techniques. Candidates for the latter include dynamic secondary ion mass spectrometry (D-SIMS). The latest generation of D-SIMS, the Cameca NanoSIMS 50, permits the localization of specific, isotopically labeled molecules and macromolecules in sections of biological material with a resolution in the tens of nanometers and with a sensitivity approaching in principle that of a single protein. Here we use two different systems, crystals of glycine and mixtures of proteins, to show that the formation of recombinant CN secondary ions under Cs bombardment can be exploited to create a new colocalization technique. We show experimentally that the formation of the recombinant (13)C(15)N secondary ion between (13)C- and (15)N-labeled macromolecules is indeed an indicator of the distance between the interacting macromolecules and on their shape. We build up a convolution model of the mixing-recombination process in D-SIMS that allows quantitative interpretations of the distance-dependent formation of the recombinant CN. Our results show that macromolecules can be colocalized if they are within 2 nm of one another. We discuss the potential advantages of this new technique for biological applications.

Metal-assisted secondary ion mass spectrometry using atomic (Ga+, In+) and fullerene projectiles.

The advantages and drawbacks of using either monatomic or buckminsterfullerene primary ions for metal-assisted secondary ion mass spectrometry (MetA-SIMS) are investigated using a series of organic samples including additive molecules, polyolefins, and small peptides. Gold deposition is mostly performed by sputter-coating, and in some cases, the results are compared to those of thermal evaporation (already used in a previous article: Delcorte, A.; Médard, N.; Bertrand, P. Anal. Chem. 2002, 74, 4955). The microstructure of the gold-covered sample surfaces is assessed by scanning and transmission electron microscopies. The merits of the different sets of experimental conditions are established via the analysis of fragment and parent-like ion yields. For most of the analyzed samples, the highest yields of fragment and parent-like ions are already reached with the sole use of C60+ projectiles. Metallization of the sample does not lead to a significant additional enhancement. For polyethylene and polypropylene, however, gold metallization associated with Ga+/In+ projectiles appears to be the only way to observe large cationized, sample-specific chain segments (m/z approximately 1000-2000). A detailed study of the polypropylene mass spectra as a function of gold coverage shows that the dynamics of yield enhancement by metal nanoparticles is strongly dependent on the choice of the projectile, e.g., a pronounced increase with Ga+ and a slow decay with C60+. The cases of Irganox 1010, a polymer antioxidant, and leucine enkephalin, a small peptide, allow us to investigate the specific influence of the experimental conditions on the emission of parent(like) ions such as M+, (M + Na)+, and (M + Au)+. The results show a dependence on both the type of sample and the considered secondary ion. Using theoretical and experimental arguments, the discussion identifies some of the mechanisms underlying the general trends observed in the results. Guidelines concerning the choice of the experimental conditions for MetA-SIMS are provided.

Understanding gold-thiolate cluster emission from self-assembled monolayers upon kiloelectronvolt ion bombardment.

This article focuses on the emission of organometallic clusters upon kiloelectronvolt ion bombardment of self-assembled monolayers. It is particularly relevant for the elucidation of the physical processes underlying secondary ion mass spectrometry (SIMS). The experimental system, an overlayer of octanethiols on gold, was modeled by classical molecular dynamics, using a hydrocarbon potential involving bonding and nonbonding interactions (AIREBO). To validate the model, the calculated mass and energy distributions of sputtered atoms and molecules were compared to experimental data. Our key finding concerns the emission mechanism of large clusters of the form MxAuy up to M6Au5 (where M is the thiolate molecule), which were not observed under sub-kiloelectronvolt projectile bombardment. Statistically, they are predominantly formed in high-yield events, where many atoms, fragments, and (supra)molecular species are desorbed from the surface. From the microscopic viewpoint, these high-yield events mostly stem from the confinement of the projectile and recoil atom energies in a finite microvolume of the sample surface. As a result of the high local energy density, molecular aggregates desorb from an overheated liquidlike region surrounding the impact point of the projectile.

Metal salts for molecular ion yield enhancement in organic secondary ion mass spectrometry: a critical assessment.

In a search for molecular ion signal enhancement in organic SIMS, the efficiency of a series of organic and inorganic salts for molecular cationization has been tested using a panel of nonvolatile molecules with very different chemical characteristics (leucine enkephalin, Irganox 1010, tetraphenylnaphthalene, polystyrene). The compounds used for cationization include alkali bromide and group Ib metal salts (XBr with X = Li, Na, K; CF3CO2Ag; AgNO3; [CH3COCH=C(O-)CH3]2Cu; AuCl3). Alkali ions, very good for polar molecule cationization, prove to be of limited interest for nonpolar molecules such as polystyrene. Silver trifluoroacetate displays excellent results for all the considered molecules, except for leucine enkephalin (which might be due to the use of different solvents for the analyte and the salt). Instead, silver nitrate mixed with leucine enkephalin in an ethanol solution provides intense molecular signals. The influence of the respective concentrations of analyte and salt in solution, of the silver trifluoroacetate solution stability, and of the sample microstructure on the secondary ion intensities are also investigated. The results of other combinations of analyte and salts are reported. Finally, the use of salts is critically compared to other sample preparation procedures previously proposed for SIMS analysis of large organic molecules.

Sample metallization for performance improvement in desorption/ionization of kilodalton molecules: quantitative evaluation, imaging secondary ion MS, and laser ablation.

The metallization procedure, proposed recently for signal improvement in organic secondary ion mass spectrometry (SIMS) (Delcorte, A.; Médard, N.; Bertrand, P. Anal.Chem. 2002, 74, 4955)., has been thoroughly tested for a set of kilodalton molecules bearing various functional groups: Irganox 1010, polystyrene, polyalanine, and copper phthalocyanine. In addition to gold, we evaluate the effect of silver evaporation as a sample treatment prior to static SIMS analysis. Ion yields, damage cross sections, and emission efficiencies are compared for Ag- and Au-metallized molecular films, pristine coatings on silicon, and submonolayers of the same molecules adsorbed on silver and gold. The results are sample-dependent but as an example, the yield enhancement calculated for metallized Irganox films with respect to untreated coatings is larger than 2 orders of magnitude for the quasimolecular ion and a factor of 1-10 for characteristic fragments. Insights into the emission processes of quasimolecular ions from metallized surfaces are deduced from kinetic energy distribution measurements. The advantage of the method for imaging SIMS applications is illustrated by the study of a nonuniform coating of polystyrene oligomers on a 100-microm polypropylene film. The evaporated metal eliminates sample charging and allows us to obtain enhanced quality images of characteristic fragment ions as well as reasonably contrasted chemical mappings for cationized PS oligomers and large PP chain segments. Finally, we report on the benefit of using metal evaporation as a sample preparation procedure for laser ablation mass spectrometry. Our results show that the fingerprint spectra of Au-covered polystyrene, polypropylene, and Irganox films can be readily obtained under 337-nm irradiation, a wavelength for which the absorption of polyolefins is low. This is probably because the gold clusters embedded in the sample surface absorb and transfer the photon energy to the surrounding organic medium.

Organic secondary ion mass spectrometry: sensitivity enhancement by gold deposition.

Hydrocarbon oligomers, high-molecular-weight polymers, and polymer additives have been covered with 2-60 nmol of gold/cm2 in order to enhance the ionization efficiency for static secondary ion mass spectrometry (s-SIMS) measurements. Au-cationized molecules (up to -3,000 Da) and fragments (up to the trimer) are observed in the positive mass spectra of metallized polystyrene (PS) oligomer films. Beyond 3,000 Da, the entanglement of polymer chains prevents the ejection of intact molecules from a "thick" organic film. This mass limit can be overcome by embedding the polymer chains in a low-molecular-weight matix. The diffusion of organic molecules over the metal surfaces is also demonstrated for short PS oligomers. In the case of high-molecular-weight polymers (polyethylene, polypropylene, PS) and polymer additives (Irganox 1010, Irgafos 168), the metallization procedure induces a dramatic increase of the fingerprint fragment ion yields as well as the formation of new Aucationized species that can be used for chemical diagnostics. In comparison with the deposition of submonolayers of organic molecules on metallic surfaces, metal evaporation onto organic samples provides a comparable sensitivity enhancement. The distinct advantage of the metal evaporation procedure is that it can be used for any kind of organic sample, irrespective of thickness, opening new perspectives for "real world" sample analysis and chemical imaging by s-SIMS.

Molecule liftoff from surfaces.

Molecular dynamics simulations have been used to model the kiloelectronvolt particle bombardment of organic layers on metal substrates such as occurs in the analytical techniques of secondary ion mass spectrometry and fast atom bombardment mass spectrometry. Vignettes of insights gained from the simulations along with comparisons to experimental data are presented in this Account. Topics include intact molecular ejection vs fragmentation, prediction of reaction pathways, influence of the substrate, and quantitative predictions of energy and angular distributions.