ABSTRACT
Speckle photography can be used to monitor deformations of solid surfaces. Its measuring characteristics, such as range or lateral resolution, depend heavily on the optical recording and illumination setup. I show how, by the addition of two suitably perforated masks, the effective optical aperture of the system may vary from point to point of the surface, accordingly adapting the range and resolution to local requirements. Furthermore, by illuminating narrow areas, speckle size can be chosen independently from the optical aperture, thus lifting an important constraint on the choice of the latter. The technique, which I believe to be new, is described within the framework of digital defocused speckle photography under normal collimated illumination. Mutually limiting relations between the range of measurement and the spatial frequency resolution turn up both locally and when the whole surface under study is considered. They are deduced and discussed in detail. Finally, experimental results are presented.
ABSTRACT
Defocused speckle photography has long been used to measure rotations of rough surfaces. By addition of a suitably perforated mask, some measurement properties, such as range and lateral resolution, may be changed at will. In particular, the maximum measurable tilt can be significantly increased, although at the expense of poorer lateral resolution. Advantages of this compared with previously described techniques include independent tuning of speckle size and optical system aperture and greater adaptability to various measuring needs. The benefits and disadvantages of the new and old techniques are thoroughly compared.
