Retentive Strength of Y-TZP Crowns: Comparison of Different Silica Coating Methods on the Intaglio Surfaces.

OBJECTIVE: To evaluate the effect of different methods of silica deposition on the intaglio surface of yttrium oxide stabilized zirconia polycrystal (Y-TZP) crowns on the retentive strength of the crowns. METHODS: One hundred simplified full-crown preparations produced from fiber-reinforced polymer material were scanned, and 100 Y-TZP crowns with occlusal retentions were milled. Crown/preparation assemblies were randomly allocated into five groups (n=20) according to the treatment of the intaglio surfaces: TBS = tribochemical silica coating via air-abrasion with 30-µm silica-coated alumina particles; GHF1 = application of thin glaze layer + hydrofluoric acid (HF) etching for 1 minute; GHF5 = glaze application + HF for 5 minutes; GHF15 = glaze application + HF for 15 minutes; NANO = silica nanofilm deposition (5 nm) via magnetron sputtering. All groups received a silane application. The surfaces of the preparations (polymer) were conditioned with 10% HF for 30 seconds and silanized. The crowns were cemented with resin cement, thermocycled (12,000 cycles; 5°C/55°C), stored for 60 days, and subjected to a retentive strength test (0.5 mm/min until failure). The retention data (MPa) were analyzed using one-way analysis of variance, Tukey tests, and Weibull analysis. Failures were classified as 50C (above 50% of cement in the crown) and 50S (above 50% of cement on the substrate). RESULTS: The TBS (5.6±1.7 MPa) and NANO groups (5.5±1 MPa) had higher retentive strength than the other groups (p<0.0001) and had the highest values of characteristic strength. There was no difference in Weibull modulus, except for the GHF1 group (lower values). The TBS and GHF15 groups, respectively, had 60% and 70% of their failures classified as 50C, while most of the other groups had 50S failures. CONCLUSION: Tribochemical silica coating and silica nanofilm deposition on the inner surface of zirconia crowns promoted a higher retentive strength.

Note: Direct piezoelectric effect microscopy.

An alternative method for investigating piezoelectric surfaces is suggested, exploiting the direct piezoeffect. The technique relies on acoustic (ultrasonic) excitation of the imaged surface and mapping of the resulting oscillatory electric potential. The main advantages arise from the spatial resolution of the conductive scanning probe microscopy in combination with the relatively large magnitude of the forward piezo signal Upf, which can be of the order of tens of mV even for non-ferroelectric piezoelectric materials. The potency of this experimental strategy is illustrated with measurements on well-crystallized quartz surfaces, where Upf ∼ 50 mV, for a piezoelectric coefficient of d33 = - 2.27 × 10(-12) m/V, and applied stress of about T3 ∼ 5.7 kPa.