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1.
Opt Express ; 27(10): 13895-13909, 2019 May 13.
Article in English | MEDLINE | ID: mdl-31163847

ABSTRACT

We propose a novel device defined as Random Optical Grating by Ultraviolet or ultrafast laser Exposure (ROGUE), a new type of fiber Bragg grating (FBG), exhibiting a weak reflection over a large bandwidth, which is independent of the length of the grating. This FBG is fabricated simply by dithering the phase randomly during the writing process. This grating has an enhanced backscatter, several orders of magnitude above typical Rayleigh backscatter of standard SMF-28 optical fiber. The grating is used in distributed sensing using optical frequency domain reflectometry (OFDR), allowing a significant increase in signal to noise ratio for strain and temperature measurement. This enhancement results in significantly lower strain or temperature noise level and accuracy error, without sacrificing the spatial resolution. Using this method, we show a sensor with a backscatter level 50 dB higher than standard unexposed SMF-28, which can thus compensate for increased loss in the system.

2.
Opt Express ; 27(3): 2488-2498, 2019 Feb 04.
Article in English | MEDLINE | ID: mdl-30732286

ABSTRACT

Laser-written waveguides in glass have many potential applications as photonic devices. However, there is little knowledge of the actual profile of the usually asymmetric refractive index (RI) change across the femtosecond (fs) laser-written waveguides. We show, here, a new nondestructive method to measure any symmetric or asymmetric two-dimensional RI profile of fs laser-written waveguides in transparent materials. The method is also suitable for the measurement of the RI profile of any other type of waveguide. A Mach-Zehnder interferometer is used to obtain the phase shift of light propagating transversely through the RI-modified region. A genetic algorithm is then used to determine the matching cross-sectional RI profile based on the known waveguide shape and dimensions. A validation of the method with the comparison to a RNF measurement of the industry-standard SMF-28 is presented, as well as a demonstration of its versatility with measurements on fs laser-written waveguides.

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