Direct experimental observation of stacking fault scattering in highly oriented pyrolytic graphite meso-structures.

Stacking fault defects are thought to be the root cause for many of the anomalous transport phenomena seen in high-quality graphite samples. In stark contrast to their importance, direct observation of stacking faults by diffractive techniques has remained elusive due to fundamental experimental difficulties. Here we show that the stacking fault density and resistance can be measured by analyzing the non-Gaussian scatter observed in the c-axis resistivity of mesoscopic graphite structures. We also show that the deviation from Ohmic conduction seen at high electrical field strength can be fit to a thermally activated transport model, which accurately reproduces the stacking fault density inferred from the statistical analysis. From our measurements, we conclude that the c-axis resistivity is entirely determined by the stacking fault resistance, which is orders of magnitude larger than the inter-layer resistance expected from a Drude model.

Field stitching in thermal probe lithography by means of surface roughness correlation.

A novel stitching method is presented which does not require special purpose alignment markers and which is particularly adapted to probe lithographic methods, enabling the writing of large patterns exceeding the size limitations imposed by high precision scan stages. The technique exploits the natural roughness of polymeric resist surfaces as a fingerprint marker for the sample position. Theoretical and experimental evidence is provided that sub-nanometer metrological accuracy can be achieved by inspecting the surface roughness in areas with 1 µm linear dimensions. The method has been put to the test in a thermal probe lithography experiment by writing a composite pattern consisting of five 10 µm × 10 µm fields which are seamlessly joined together. The observed stitching error of 10 nm between fields is dominated by inaccuracies of the scanning hardware used in the experiment and is not fundamentally limited by the method per se.

Wear-less floating contact imaging of polymer surfaces.

An atomic force microscopy (AFM) technique is described combining two operating modes that previously were mutually exclusive: gentle imaging of delicate surfaces requiring slow dynamic AFM techniques, and passive feedback contact mode AFM enabling ultra-fast imaging. A high-frequency force modulation is used to excite resonant modes in the MHz range of a highly compliant cantilever force sensor with a spring constant of 0.1 N m( - 1). The high-order mode acts as a stiff system for modulating the tip-sample distance and a vibration amplitude of 1 nm is sufficient to overcome the adhesion interaction. The soft cantilever provides a force-controlled support for the vibrating tip, enabling high-speed intermittent contact force microscopy without feedback control of the cantilever bending. Using this technique, we were able to image delicate polymer surfaces and to completely suppress the formation of the ripple wear patterns that are commonly observed in contact AFM.

Multi Tbit/in(2) storage densities with thermomechanical probes.

Exploiting the spatial resolution of scanning probes presents an attractive approach for novel data storage technologies in particular for large-scale data repositories because of their inherent potential for high storage density. We show that multi-Tbit/in(2) density can be achieved by means of thermomechanically embossing the information as indentation marks into a polymer film. The data density is determined by the nonlinear interaction between closely spaced indents and the fundamental scaling relations governing the shape and size of the indents. We find that cooperative effects in polymers give rise to a minimum indentation radius on the order of the correlation length of the cooperatively rearranged region even if formed by an infinitely sharp indenter. Thus, cooperativity coupled to alpha-transitions in polymers is evinced in a real space geometrical experiment. Furthermore, we predict that indentation marks cannot be made smaller than 5 nm in diameter, which limits the feature resolution for embossing technologies in general.

Relaxation kinetics of nanoscale indents in a polymer glass.

Nanometer scale indents have been written in a cross-linked polystyrene sample, and their relaxation has been studied at annealing temperatures well below the glass transition of the polymer. The indents represent a highly nonequilibrium state of the polymer which is subjected to mechanical stress of up to 0.4 GPa and thermal quench rates on the order of 10{8} K/s during writing. It is shown that the relaxation towards equilibrium evolves logarithmically over more than 10 orders of magnitude in time. The relaxation kinetics are accurately described in terms of a thermally activated process with an energy barrier whose magnitude decreases linearly with the distance from equilibrium.

Nanoscale shape-memory function in highly cross-linked polymers.

Topographic engraving of structures in polymer surfaces attracts widespread interest for application in imprint lithography and data storage. We study the nonlinear interaction of nanoindents written in close proximity, 20-100 nm, to one another in a highly cross-linked polystyrene matrix. The indents are created thermomechanically by applying heat and force stimuli of 10 micros duration to a tip, thereby raising the polymer temperature to 250 degrees C and exerting contact pressures of up to 1 GPa. We show that on the nanoscale plastic deformation is highly reversible providing outstanding shape-memory functionality of the material.

Self-similarity and finite-size effects in nano-indentation of highly cross-linked polymers.

The scalability of thermomechanical polymer deformations in the sub-10 nm regime is of particular importance for nano-imprint techniques, hardness measurements of thin films by nano-indentations, and scanning-probe-based thermomechanical data storage. We investigate nano-indentation in the sub-10 nm regime performed on highly cross-linked polymer films of different thicknesses. It is shown that the lateral and vertical geometric characteristics of the indents independently scale down to an indent depth of 1 nm and that the scaling parameters are functions of the film thickness and the temperature of the indenter. However, in the limit of shallow indents the scaling of the cross-coupling between lateral and vertical dimensions is lost. It is argued that the breakdown of self-similarity is due to a minimum strain requirement originating from the co-operative nature of the polymer response induced by α transitions which lock the indent in the deformed state. The results shed new light on the fundamental processes and size effects involved in nanoscale plastic replication, in general.