Comparison of film measurements and Monte Carlo simulations of dose delivered with very high-energy electron beams in a polystyrene phantom.

PURPOSE: To measure radiation dose in a water-equivalent medium from very high-energy electron (VHEE) beams and make comparisons to Monte Carlo (MC) simulation results. METHODS: Dose in a polystyrene phantom delivered by an experimental VHEE beam line was measured with Gafchromic films for three 50 MeV and two 70 MeV Gaussian beams of 4.0-6.9 mm FWHM and compared to corresponding MC-simulated dose distributions. MC dose in the polystyrene phantom was calculated with the EGSnrc/BEAMnrc and DOSXYZnrc codes based on the experimental setup. Additionally, the effect of 2% beam energy measurement uncertainty and possible non-zero beam angular spread on MC dose distributions was evaluated. RESULTS: MC simulated percentage depth dose (PDD) curves agreed with measurements within 4% for all beam sizes at both 50 and 70 MeV VHEE beams. Central axis PDD at 8 cm depth ranged from 14% to 19% for the 5.4-6.9 mm 50 MeV beams and it ranged from 14% to 18% for the 4.0-4.5 mm 70 MeV beams. MC simulated relative beam profiles of regularly shaped Gaussian beams evaluated at depths of 0.64 to 7.46 cm agreed with measurements to within 5%. A 2% beam energy uncertainty and 0.286° beam angular spread corresponded to a maximum 3.0% and 3.8% difference in depth dose curves of the 50 and 70 MeV electron beams, respectively. Absolute dose differences between MC simulations and film measurements of regularly shaped Gaussian beams were between 10% and 42%. CONCLUSIONS: The authors demonstrate that relative dose distributions for VHEE beams of 50-70 MeV can be measured with Gafchromic films and modeled with Monte Carlo simulations to an accuracy of 5%. The reported absolute dose differences likely caused by imperfect beam steering and subsequent charge loss revealed the importance of accurate VHEE beam control and diagnostics.

Femtosecond visualization of laser-induced optical relativistic electron microbunches.

It has long been known that lasers can interact with relativistic electrons in magnetic undulators to imprint sinusoidal modulations that can be used to slice electrons into microbunches equally separated at the laser wavelength. Here we report on the first direct measurement of laser-induced microbunching of a relativistic electron beam with femtosecond resolution in the time domain. Using a modified zero-phasing technique to map the electron beam's temporal structures into the energy space, we show that this method can be used to directly quantify the time and spectral content of coherent current modulations imprinted on the beam for harmonic and multicolor lasing applications in accelerator-based light sources.

Experimental demonstration of a tunable microwave undulator.

Static magnetic undulators used by x-ray light sources are fundamentally too limited to achieve shorter undulator periods and dynamic control. To overcome these limitations, we report experimental demonstration of a novel short-period microwave undulator, essentially a Thomson scattering device, that has yielded tunable spontaneous emission and seeded coherent radiation. Its equivalent undulator period (λu) is 13.9 mm while it has achieved an equivalent magnetic field of 0.65 T. For future-generation light sources, this device promises a shorter undulator period, a large aperture, and fast dynamic control.

A well-planned security program can help determine FTE needs.

Determining how many officers you need is not a simple process, the author points out. Achieving an effective and budget-wise solution is a continuous process that needs to be evaluated and re-evaluated over time. In this article he reviews the many factors that have to be considered.