Demonstration of stimulated emission depletion phenomenon in luminescence of solid-state scintillator excited by soft X-rays.

Although imaging techniques using soft X-rays (SXs) are being developed as the available photon flux increases because of the continuing development of synchrotron light sources, it will be necessary to downsize the pixel size of the SX camera to produce finer SX images. Application of the stimulated emission depletion (STED) method to a scintillator plate followed by use of this plate as a sensor is one promising method to reduce the pixel size of SX cameras. A STED phenomenon occurred in the luminescence of a Ce-doped Lu2SiO5 crystal (Ce:LSO) excited using ultraviolet (UV) light when the scintillator was irradiated with azimuthally polarized laser light in the photon energy range from 1.97 eV (630 nm) to 2.58 eV (480 nm). When the excitation light source changed to synchrotron radiation (SR) light with photon energy of 800 eV, the same STED phenomenon occurred. The spot size of the luminescence was reduced by the STED phenomenon and this spot size decreased as the STED laser's photon energy increased. The energy dependence of the Ce:LSO luminescence levels can be used to explain the change in the spot size at the luminescence point.

Soft X-ray spectral analysis of laser produced molybdenum plasmas using the fundamental and second harmonics of a Nd:YAG laser.

Our measurement of the soft X-ray emission of Mo plasmas produced by picosecond Nd:YAG lasers emitting on the fundamental (1064 nm, 150 ps) and second (532 nm, 130 ps) harmonics is presented. The contrast in intensity between spectral peaks and the intensity outside them is lower for the second harmonic produced plasmas probably due to the presence more intense satellite emission and higher optical thickness. The measured spectra are absolutely calibrated and the observed output photon flux was (7 - 9) × 1013 photons/sr in the water-window (2.3 - 4.4 nm) spectral range for a laser energy of 160 mJ independent of laser wavelength. However, in the short wavelength range 1.5 - 2 nm, the emission using the second harmonic is strongly enhanced and is even higher than for the maximum energy of 220 mJ of the fundamental wavelength, so despite inevitable energy losses, laser wavelength conversion may lead to emission enhancement in certain spectral ranges. This enhancement is attributed to higher absorption of short wavelength laser light and higher charge state generation in denser plasmas.

Enhancement of water-window soft x-ray emission from laser-produced Au plasma under low-pressure nitrogen atmosphere.

To generate bright water-window (WW) soft x rays (2.3-4.4 nm), gold slab targets were irradiated with laser pulses (1064 nm, 7 ns, 1 J). Emission spectroscopy showed that the introduction of low-pressure nitrogen enhanced the soft x-ray yield emitted from the laser-produced Au plasma. The intensity of the WW x-ray transported in a 400-Pa N2 atmosphere from the laser-produced plasma increased by 3.8 times over that in vacuum. Considering a strong x-ray absorption, the x-ray yield emitted directly from the Au plasma in the N2 gas was evaluated to be 13 times higher than that in vacuum. Although similar measurements were made for various gases, only N2 gas causes an increase in a soft x-ray yield. The processes leading to this enhancement mechanism were revealed by using hydrodynamic simulation and atomic structure codes.

Quantitative Distribution of DNA, RNA, Histone and Proteins Other than Histone in Mammalian Cells, Nuclei and a Chromosome at High Resolution Observed by Scanning Transmission Soft X-Ray Microscopy (STXM).

Soft X-ray microscopy was applied to study the quantitative distribution of DNA, RNA, histone, and proteins other than histone (represented by BSA) in mammalian cells, apoptotic nuclei, and a chromosome at spatial resolutions of 100 to 400 nm. The relative distribution of closely related molecules, such as DNA and RNA, was discriminated by the singular value decomposition (SVD) method using aXis2000 software. Quantities of nucleic acids and proteins were evaluated using characteristic absorption properties due to the 1s⁻π * transition of N=C in nucleic acids and amide in proteins, respectively, in the absorption spectra at the nitrogen K absorption edge. The results showed that DNA and histone were located in the nucleus. By contrast, RNA was clearly discriminated and found mainly in the cytoplasm. Interestingly, in a chromosome image, DNA and histone were found in the center, surrounded by RNA and proteins other than histone. The amount of DNA in the chromosome was estimated to be 0.73 pg, and the content of RNA, histone, and proteins other than histone, relative to DNA, was 0.48, 0.28, and 4.04, respectively. The method we present in this study could be a powerful approach for the quantitative molecular mapping of biological samples at high resolution.

Intense water-window soft x-ray emission by spectral control using dual laser pulses.

We demonstrate intense emission in the water-window soft x-ray spectral region by controlling the spectral behavior through changing the balance between emissivity and self-absorption in an expanding plasma. The number of photons obtained from a dual laser irradiated target with a 150-ps pre-pulse was maximized at 3.8 × 1014 photons/sr in λ = 2.34 - 4.38 nm at a pulse separation time of 7 - 10 ns. Enhancement of the number of photons is attributed to efficient coupling with the main laser pulse while maintaining a tiny source size.

Emission of water-window soft x-rays under optically thin conditions using low-density foam targets.

The effect of optical thickness in a bismuth water-window soft x-ray source is considered by comparing the emission from laser-produced plasmas of a 7.5% atomic density foam target and a solid-density target. The number of photons recorded in the 4 nm region was comparable for both targets at a plasma-initiating laser pulse duration of 6 ns. From experiments at different pulse durations of 150 ps and 6 ns, self-absorption (opacity) effects were found to be relatively small for bismuth plasmas as compared to those of tin, based on the same emission mechanism and which are used in 13.5 nm sources for extreme ultraviolet lithography.

Selection of target elements for laser-produced plasma soft x-ray sources.

We demonstrated the upper limitation to the number of shots, i.e., target lifetime, together with the number of photons emitted in the water-window soft x-ray spectral region from a number of targets used as sources in this spectral region, for multi-shot irradiation at the same position on the target surface. The spectra involved result from unresolved transition arrays originating from n=3-n=4 transitions in medium-Z element plasmas and from n=4-n=4 transitions originating in high-Z plasmas. The output flux was maintained for the highest number of shots in the case of the high melting point element molybdenum, and the total output in the water window was 7.7×1013 photons/sr at a laser power density of 1.2×1014 W/cm2.

Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm.

A flat-field grazing incidence spectrometer operating on the spectral region from 1 to 10 nm was built for research on physics of high temperature and high energy density plasmas. It consists of a flat-field grating with 2400 lines/mm as a dispersing element and an x-ray charged coupled device (CCD) camera as the detector. The diffraction efficiency of the grating and the sensitivity of the CCD camera were directly measured by use of synchrotron radiation at the BL-11D beamline of the Photon Factory (PF). The influence of contamination to the spectrometer also was characterized. This result enables us to evaluate the absolute number of photons in a wide range wavelength between 1 and 10 nm within an acquisition. We obtained absolutely calibrated spectra from highly charged ion plasmas of Gd, from which a maximum energy conversion efficiency of 0.26% was observed at a Nd:YAG laser intensity of 3 × 1012 W/cm2.

SAMRAI: a novel variably polarized angle-resolved photoemission beamline in the VUV region at UVSOR-II.

A novel variably polarized angle-resolved photoemission spectroscopy beamline in the vacuum-ultraviolet (VUV) region has been installed at the UVSOR-II 750 MeV synchrotron light source. The beamline is equipped with a 3 m long APPLE-II type undulator with horizontally/vertically linear and right/left circular polarizations, a 10 m Wadsworth type monochromator covering a photon energy range of 6-43 eV, and a 200 mm radius hemispherical photoelectron analyzer with an electron lens of a +/-18 degrees acceptance angle. Due to the low emittance of the UVSOR-II storage ring, the light source is regarded as an entrance slit, and the undulator light is directly led to a grating by two plane mirrors in the monochromator while maintaining a balance between high-energy resolution and high photon flux. The energy resolving power (hnu/Deltahnu) and photon flux of the monochromator are typically 1 x 10(4) and 10(12) photons/s, respectively, with a 100 microm exit slit. The beamline is used for angle-resolved photoemission spectroscopy with an energy resolution of a few meV covering the UV-to-VUV energy range.

High throughput and wide field of view EUV microscope for blur-free one-shot imaging of living organisms.

We present and demonstrate the use of an extreme ultraviolet (EUV) microscope that was developed in-house. Images are acquired using Bragg reflection multilayer optics and a laser-produced plasma light source. The upper-limit spatial resolution of the EUV microscope is 130 nm with a 10 ns exposure time and 250 x 250 microm(2) field of view. Resolution is superior to that of visible microscopes with the same size of field of view, and the exposure time is short enough to observe fine structures in-vivo. Observation of the cerebral cortex of a mouse is demonstrated.

Aging and thermal stability of Mg/SiC and Mg/Y2O3 reflection multilayers in the 25-35 nm region.

Reflection measurements in the 25-35 nm region were made for Mg/SiC and Mg/Y2O3 multilayers kept in a low-humidity atmosphere for 4 or 5 years. Aged Mg/SiC multilayers keep their reflectances, and the reflectance value at 31.2 nm is 0.44 at 10 degrees of the normal angle of incidence. Aged Mg/Y2O3 multilayers change reflectance as top layer materials, and the best value at 30.1 nm is 0.40 at 10 degrees. Reflection measurements are also made for Mg-based multilayers that are annealed from room temperature to 400 degrees C at 50 degrees C intervals. Both multilayers keep their reflectance at annealing temperatures of 200 degrees C. These results suggest that both Mg-based multilayers can be applied to practical optics.