Application of a Cryo-FIB-SEM-µRaman Instrument to Probe the Depth of Vitreous Ice in a Frozen Sample.

The development of instruments combining multiple characterization and imaging tools drove huge advances in material science, engineering, biology, and other related fields. Notably, the coupling of SEM with micro-Raman spectrometry (µRaman) provides the means for the correlation between structural and physicochemical properties at the surface, while dual focused ion beam (FIB)-scanning electron microscopes (SEMs) operating under cryogenic conditions (cryo-FIB-SEM) allow for the analysis of the ultrastructure of materials in situ and in their native environment. In cryo-FIB-SEM, rapid and efficient methods for assessing vitrification conditions in situ are required for the accurate investigation of the original structure of hydrated samples. This work reports for the first time the use of a cryo-FIB-SEM-µRaman instrument to efficiently assess the accuracy of cryo-fixation methods. Analyses were performed on plunge-freezed highly hydrated calcium phosphate cement (CPC) and a gelatin composite. By making a trench of a defined thickness with FIB, µRaman analyses were carried out at a specific depth within the frozen material. Results show that the µRaman signal is sensitive to the changes in the molecular structures of the aqueous phase and can be used to examine the depth of vitreous ice in frozen samples. The method presented in this work provides a reliable way to avoid imaging artifacts in cryo-FIB-SEM that are related to cryo-fixation and therefore constitutes great interest in the study of vitreous materials exhibiting high water content, regardless of the sample preparation method (i.e., by HPF, plunge freezing, and so on).

A Simple Approach for Thickness Measurements Using Electron Probe Microanalysis.

A simple and fast method for thickness measurements using electron probe microanalysis (EPMA) is described. The method is applicable on samples with a thickness smaller than the electron depth range and does not require any knowledge of instrumental parameters. The thickness is determined by means of the distance that electrons travel inside the sample before crossing through it. Samples are first deposited on a substrate that, when reached by the transmitted electrons, produces an X-ray signal. The measured characteristic X-ray line intensity of the substrate is later used to determine the energy of transmitted electrons, which is proportional to the distance that electrons travel inside the sample. The study was performed on spherical K411 glass particles and cylindrical particles of U­Ce oxide with a size ranging from 0.2 to 4 µm. The measured thicknesses of all the studied particles showed good agreements with the real values. Although the method is only validated on particles with usual shapes, it can be applied to determine a local thickness of thin samples with irregular morphologies. This can help solving multiple issues in analysis with EPMA of non-bulk samples exhibiting complex geometries. Three dimensional microscopic imaging could also find a good utility in the described method.

Characterization of the Chemical Composition of Uranium Microparticles with Irregular Shapes Using Standardless Electron Probe Microanalysis and Micro-Raman Spectrometry.

We describe an approach enabling the identification of the elemental composition of uranium microparticles with undefined geometry using standardless quantitative electron probe microanalysis (EPMA) and micro-Raman spectrometry (MRS). The standardless procedure is based on a ZAF peak-to-background quantitative method in combination with Monte Carlo simulations. The experimental X-ray spectra were measured with an energy-dispersive spectrometer attached to a scanning electron microscope. To account for the X-ray intensity loss due to the transmission of electrons in microparticles with irregular shapes, a method was developed enabling the determination of an apparent thickness of the particle by means of the mean distance that electrons travel inside the particle before being transmitted. Size effects were further taken into account by using peak-to-background ratios and performing simulations on a particle with a thickness equal to the apparent thickness. To assess the validity of the standardless procedure in EPMA, weight fractions were determined for NIST homogeneous spherical microparticles of K411 glass and compared to certified ones. The correction of size effects was achieved and lead to accurate quantitative results with absolute relative deviations less than 9%. The model used for the determination of the apparent thickness was validated on the set of spherical K411 particles and enabled us to conduct quantifications on irregularly shaped uranium microparticles. The chemical composition of uranium particles was further investigated using MRS which enabled us to verify the reliability of the results obtained by the standardless approach.