ABSTRACT
We describe a simple and reliable procedure for obtaining a flat plateau on top of standard silicon nitride atomic force microscopy tips by scanning them over the focus of a high-numerical-aperture objective illuminated by near-infrared ultrashort laser pulses. Flattened tips produced this way exhibit a plateau that is parallel to the substrate when the cantilever is mounted. They represent a valid and cost-effective alternative to commercially available plateau tips.
Subject(s)
Equipment Design/instrumentation , Equipment Design/methods , Microscopy, Atomic Force/instrumentation , Nanotechnology/instrumentation , Transducers , Equipment Failure Analysis , Microscopy, Atomic Force/methods , Nanotechnology/methods , Reproducibility of Results , Sensitivity and SpecificityABSTRACT
The interaction of a single quantum dot with a bowtie antenna is demonstrated for visible light. The antenna is generated at the apex of a Si3N4 atomic force microscopy tip by focused ion beam milling. When scanned over the quantum dot, its photoluminescence is enhanced while its excited-state lifetime is decreased. Our observations demonstrate that the relaxation channels of a single quantum emitter can be controlled by coupling to an efficiently radiating metallic nanoantenna.
