ABSTRACT
We derive an analytic expression for the height correlation function of a homogeneous, isotropic rough surface based on the inverse wave scattering method of Kirchhoff theory. The expression directly relates the height correlation function to diffuse scattered intensity along a linear path at fixed polar angle. We test the solution by measuring the angular distribution of light scattered from rough silicon surfaces and comparing extracted height correlation functions to those derived from atomic force microscopy (AFM). The results agree closely with AFM over a wider range of roughness parameters than previous formulations of the inverse scattering problem, while relying less on large-angle scatter data. Our expression thus provides an accurate analytical equation for the height correlation function of a wide range of surfaces based on measurements using a simple, fast experimental procedure.
ABSTRACT
The statistics of isoheight lines in the (2+1) -dimensional Kardar-Parisi-Zhang (KPZ) model is shown to be conformally invariant and equivalent to those of self-avoiding random walks. This leads to a rich variety of exact analytical results for the KPZ dynamics. We present direct evidence that the isoheight lines can be described by the family of conformally invariant curves called Schramm-Loewner evolution (or SLE_{kappa} ) with diffusivity kappa=8/3 . It is shown that the absence of the nonlinear term in the KPZ equation will change the diffusivity kappa from 8/3 to 4, indicating that the isoheight lines of the Edwards-Wilkinson surface are also conformally invariant and belong to the universality class of domain walls in the O(2) spin model.
ABSTRACT
We investigate the Markov property of rough surfaces. Using stochastic analysis, we characterize the complexity of the surface roughness by means of a Fokker-Planck or Langevin equation. The obtained Langevin equation enables us to regenerate surfaces with similar statistical properties compared with the observed morphology by atomic force microscopy.
