A kelvin probe force microscopy of charged indentation-induced dislocation structures in KBr.

The incipient stages of plasticity in KBr single crystals have been examined in ultra-high vacuum by means of atomic force microscopy and Kelvin probe force microscopy (KPFM). Conducting diamond-coated tips have been used to both indent the crystals and image the resulting plastic deformation. KPFM reveals that edge dislocations intersecting the surface carry a negative charge similarly to kinks in surface steps, while screw dislocations show no contrast. The charges are attributed to trapped cation vacancies which compensate the charge of divalent impurities. Furthermore, the site of indentation has been found to carry a large positive charge. Weak topographic features extending in the <110> direction from the indentation are identified by atomic-resolution imaging to be pairs of edge dislocations of opposite sign, separated by a distance similar to the indenter radius. They indicate the glide of two parallel {110} planes perpendicular to the surface, a process which allows for a slice of KBr to be pushed away from the indentation site.

Friction and dissipation in epitaxial graphene films.

We have studied friction and dissipation in single and bilayer graphene films grown epitaxially on SiC. The friction on SiC is greatly reduced by a single layer of graphene and reduced by another factor of 2 on bilayer graphene. The friction contrast between single and bilayer graphene arises from a dramatic difference in electron-phonon coupling, which we discovered by means of angle-resolved photoemission spectroscopy. Bilayer graphene as a lubricant outperforms even graphite due to reduced adhesion.