1.
Appl Opt
; 56(32): 9050-9056, 2017 Nov 10.
Article
in English
| MEDLINE
| ID: mdl-29131192
ABSTRACT
We track the non-uniformity of a wide area liquid crystal device using multiple cross-polarized intensity measurements. They give us not only accurate estimates of the core physical liquid crystal parameters, such as elastic constants, but also spatial maps of the device properties, including the liquid crystal thickness and pretilt angle. A bootstrapping statistical analysis, coupled with the multiple measurements, gives us reliable error bars on all the measured parameters.