ABSTRACT
Methods to prepare needle-shaped specimens for atom probe field ion microscopy from near surface regions have been developed. The material used was a cemented carbide with a composition gradient towards the surface, but the method is equally applicable for other materials. The preparation technique involves dimple grinding, electropolishing and focused ion beam (FIB) milling. The use of FIB milling allows for specimen preparation of materials which due to the preferential etching of different phases are difficult to electropolish. The technique also allows for preparation of specimens at well defined depth from the sample surface, selection of phase to be analysed, and to sharpen and re-use already analysed specimens. Atom probe analyses of the near surface zone region in a gradient sintered WC-Ti(C,N)-TaC-Co cemented carbide are presented.
