ABSTRACT
A diagnostic for extreme ultraviolet spectroscopy was fielded on the sheared-flow-stabilized (SFS) fusion Z-pinch experiment (FuZE-Q) for the first time. The spectrometer collected time-gated plasma emission spectra in the 5-40 nm wavelength (30-250 eV) range for impurity identification, radiative power studies, and for plasma temperature and density measurements. The unique implementation of the diagnostic included fast (10 ns risetime) pulsed high voltage electronics and a multi-stage differential pumping system that allowed the vacuum-coupled spectrometer to collect three independently timed spectra per FuZE-Q shot while also protecting sensitive internal components. Analysis of line emission identifies oxygen (N-, C-, B-, Be-, Li-, and He-like O), peaking in intensity shortly after maximum current (>500 kA). This work provides a foundation for future high energy spectroscopy experiments on SFS Z-pinch devices.
ABSTRACT
A direct observation of the stratified electrothermal instability on the surface of thick metal is reported. Aluminum rods coated with 70µm Parylene-N were driven to 1 MA in 100ns, with the metal thicker than the skin depth. The dielectric coating suppressed plasma formation, enabling persistent observation of discrete azimuthally correlated stratified thermal perturbations perpendicular to the current whose wave numbers, k, grew exponentially with rate γ(k)=0.06ns^{-1}-(0.4ns^{-1}µm^{2}rad^{-2})k^{2} in â¼1g/cm^{3}, â¼7000K aluminum.
ABSTRACT
The first measurement of the threshold for thermal ionization of the surface of thick metal by pulsed magnetic field (B) is reported. Thick aluminum-with depth greater than the magnetic skin layer-was pulsed with partial differential B/ partial differential t from 30-80 MG/micros. Novel loads avoided nonthermal plasma (from electron avalanche, or energetic particles or photons from arcs). Thermal plasma forms from 6061-alloy aluminum when the surface magnetic field reaches 2.2 MG, in qualitative agreement with numerical simulation results by Garanin et al. [J. Appl. Mech. Tech. Phys. 46, 153 (2005)].
